In-situ monitoring of the Atomic Force Microscopy (AFM) tip by analysing the cantilever’s higher harmonic vibrations

Activity: Talk or presentation › Talk or presentation at a conference

Description

Presentation at the International MicroNano Conference 2015, Amsterdam, The Netherlands
Period8 Dec 2015
Event titleInternational MicroNano Conference
Event typeConference
LocationAmsterdam, NetherlandsShow on map

Documents & Links

  • insituAFM

    File: application/pdf, 974 KB

    Type: Text