1. 2020
  2. A Novel Printed-Lookup-Table-Based Programmable Printed Digital Circuit

    Weller, D. D., Erozan, A. T., Rasheed, F., Bishnoi, R., Aghassi-Hagmann, J. & Tahoori, M. B., 2020, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 28, 6, p. 1496-1504 9 p.

    Research output: Contribution to journalArticleScientificpeer-review

  3. A Security Verification Template to Assess Cache Architecture Vulnerabilities

    Ghasempouri, T., Raik, J., Paul, K., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Proceedings. IEEE, p. 1-6 6 p. 9095707

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  4. Accelerating a geometrical approximated PCA algorithm using AVX2 and CUDA

    Machidon, A. L., Machidon, O. M., Ciobanu, C. B. & Ogrutan, P. L., 2020, In : Remote Sensing. 12, 12, p. 1-29 29 p., 1918.

    Research output: Contribution to journalArticleScientificpeer-review

  5. An Efficient High-Throughput LZ77-Based Decompressor in Reconfigurable Logic

    Fang, J., Chen, J., Lee, J., Al-Ars, Z. & Hofstee, P., 2020, In : Journal of Signal Processing Systems. p. 1-17 17 p.

    Research output: Contribution to journalArticleScientificpeer-review

  6. ArrowSAM: In-Memory Genomics Data Processing Using Apache Arrow

    Ahmad, T., Ahmed, N., Peltenburg, J. & Al-Ars, Z., 2020, 2020 3rd International Conference on Computer Applications & Information Security (ICCAIS): Proceedings. IEEE, p. 1-6 6 p. 9096725

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  7. CHOP: Haplotype-aware path indexing in population graphs

    Mokveld, T., Linthorst, J., Al-Ars, Z., Holstege, H. & Reinders, M., 2020, In : Genome biology. 21, 1, p. 1-16 16 p.

    Research output: Contribution to journalArticleScientificpeer-review

  8. Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 2020, Proceedings - 2019 IEEE 28th Asian Test Symposium, ATS 2019. Bilof, R. S. (ed.). Piscataway: IEEE, Vol. 2019-December. p. 129-134 6 p. 8949396. (2019 IEEE 28TH ASIAN TEST SYMPOSIUM (ATS)).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  9. Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs

    Augusto da Silva, F., Bagbaba, A. C., Sartoni, S., Cantoro, R., Reorda, M. S., Hamdioui, S. & Sauer, C., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  10. Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

    Wu, L., Fieback, M., Taouil, M. & Hamdioui, S., 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  11. ESRAM Reliability: Why is it still not optimally solved?

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9081145

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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