1. 2019
  2. On Basic Boolean Function Graphene Nanoribbon Conductance Mapping

    Jiang, Y., Laurenciu, N. C. & Cotofana, S. D., 2019, In : IEEE Transactions on Circuits and Systems I: Regular Papers. 66, 5, p. 1948-1959 12 p., 8574057.

    Research output: Contribution to journalArticleScientificpeer-review

  3. Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

    Wu, L., Rao, S., Cardoso Medeiros, G., Taouil, M., Marinissen, E. J., Yasin, F., Couet, S., Hamdioui, S. & Kar, G. S., 2019, 2019 IEEE European Test Symposium (ETS): Proceedings. Danvers: IEEE, p. 1-6 6 p. 8791518

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  4. Quantum Computer Architecture: a full-stack overview

    Bertels, K., Hogaboam, J. W. & Almudever, C. G., 2019, In : Microprocessors and Microsystems. 66, p. 21-66

    Research output: Contribution to journalSpecial issueScientificpeer-review

  5. Quantum accelerated computer architectures

    Riesebos, L., Fu, X., Moueddenne, A. A., Lao, L., Varsamopoulos, S., Ashraf, I., Van Someren, J., Khammassi, N., Almudever, C. G. & Bertels, K., 2019, 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings. Yasuura, H., Miyanaga, Y. & Kiya, H. (eds.). Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), Vol. 2019-May. 4 p. 8702488

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  6. Rebooting Computing: The Challenges for Test and Reliability

    Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K., Vatajelu, E. I., di Natale, G., Anghel, L., Nagarajan, S., Fieback, M. C. R. & Hamdioui, S., 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  7. Rebooting Our Computing Models

    Cadareanu, P., Reddy C, N., Almudever, C. G., Khanna, A., Raychowdhury, A., Bertels, K., Narayanan, V., Di Ventra, M. & Gaillardon, P-E., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, p. 1469-1476 8 p. 8715167

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  8. Refine and recycle: A method to increase decompression parallelism

    Fang, J., Chen, J., Lee, J., Al-Ars, Z. & Hofstee, H. P., 2019, 2019 IEEE 30th International Conference on Application-specific Systems, Architectures and Processors (ASAP): Proceedings. IEEE, p. 272-280 9 p. 8825015

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  9. Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

    Agbo, I., Taouil, M., Kraak, D., Hamdioui, S., Weckx, P., Cosemans, S., Raghavan, P., Catthoor, F. & Dehaene, W., 2019, In : Microelectronics Reliability. 99, p. 52-61 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

  10. Software-Based Mitigation for Memory Address Decoder Aging

    Kraak, D., Gursoy, C. C., Agbo, I. O., Taouil, M., Jenihhin, M., Raik, J. & Hamdioui, S., 2019, 2019 IEEE Latin American Test Symposium (LATS). Danvers: IEEE, p. 1-6 6 p. 8704595

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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