1. 2019
  2. Challenges and Solutions in Emerging Memory Testing

    Vatajelu, E. I., Prinetto, P., Taouil, M. & Hamdioui, S., 2019, In : IEEE Transactions on Emerging Topics in Computing. 7, 3, p. 493-506 14 p., 7894207.

    Research output: Contribution to journalArticleScientificpeer-review

  3. Code deformation and lattice surgery are gauge fixing

    Vuillot, C., Lao, L., Criger, B., García Almudever, C., Bertels, K. & Terhal, B. M., 2019, In : New Journal of Physics. 21, 3, 21 p., 033028.

    Research output: Contribution to journalArticleScientificpeer-review

  4. Computation-in-Memory based on Memristive Devices

    Du Nguyen, H. A., 2019, 166 p.

    Research output: ThesisDissertation (TU Delft)Scientific

  5. DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

    Cardoso Medeiros, G., Taouil, M., Fieback, M., Bolzani Poehls, L. M. & Hamdioui, S., 2019, Proceedings - 2019 IEEE European Test Symposium, ETS 2019: Proceedings. IEEE, Vol. 2019-May. p. 1-2 2 p. 8791517

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  6. Database Acceleration on FPGAs

    Fang, J., 2019, 93 p.

    Research output: ThesisDissertation (TU Delft)Scientific

  7. Dependable Network Topologies

    Joshi, P., 2019, 81 p.

    Research output: ThesisDissertation (TU Delft)Scientific

  8. Diminished-1 Fermat Number Transform for Integer Convolutional Neural Networks

    Baozhou, Z., Ahmed, N., Peltenburg, J., Bertels, K. & Al-Ars, Z., 2019, 2019 IEEE 4th International Conference on Big Data Analytics (ICBDA). Guan, S-U., Zhang, K. & Cao, J. (eds.). Piscataway, NJ, USA: IEEE, p. 47-52 6 p. 8713250

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  9. Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era

    Majzoub, S., Saleh, R. A., Ashraf, I., Taouil, M. & Hamdioui, S., 2019, In : IEEE Access. 7, p. 33115-33129 15 p., 8648367.

    Research output: Contribution to journalArticleScientificpeer-review

  10. Enhancing PUF based challenge-response sets by exploiting various background noise configurations

    Martin, H., Peris-Lopez, P., Di Natale, G., Taouil, M. & Hamdioui, S., 2019, In : Electronics (Switzerland). 8, 2, p. 1-14 14 p., 145.

    Research output: Contribution to journalArticleScientificpeer-review

  11. Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS

    Zandrahimi, M., Debaud, P., Castillejo, A. & Al-Ars, Z., 2019, In : Journal of Electronic Testing: Theory and Applications (JETTA). 35, 3, p. 303-315 13 p.

    Research output: Contribution to journalArticleScientificpeer-review

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