1. 2020
  2. Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories

    Münch, C., Bishnoi, R. & Tahoori, M. B., 2020, ASP-DAC 2020 : 25th Asia and South Pacific Design Automation Conference, Proceedings. IEEE, p. 393-400 8 p. 9045339

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. Tydi: an open specification for complex data structures over hardware streams

    Peltenburg, J. W., Brobbel, M., Van Straten, J., Al-Ars, Z. & Hofstee, P., 2020, In : IEEE Micro. 40, 4, p. 120-130 11 p., 9098092.

    Research output: Contribution to journalArticleScientificpeer-review

  4. 2019
  5. Defect and Fault Modeling Framework for STT-MRAM Testing

    Wu, L., Rao, S., Taouil, M., Cardoso Medeiros, G., Fieback, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 17 Dec 2019, In : IEEE Transactions on Emerging Topics in Computing. 15 p.

    Research output: Contribution to journalArticleScientificpeer-review

  6. Erratum: Correction to: GASAL2: a GPU accelerated sequence alignment library for high-throughput NGS data (BMC bioinformatics (2019) 20 1 (520))

    Ahmed, N., Lévy, J., Ren, S., Mushtaq, H., Bertels, K. & Al-Ars, Z., 19 Nov 2019, In : BMC Bioinformatics. 20, 1, 1 p., 597.

    Research output: Contribution to journalComment/Letter to the editorScientificpeer-review

  7. Device-Aware Test: A New Test Approach Towards DPPB Level

    Fieback, M., Wu, L., Cardoso Medeiros, G., Aziza, H., Rao, S., Marinissen, E. J., Taouil, M. & Hamdioui, S., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE, 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  8. Testing Computation-in-Memory Architectures Based on Emerging Memories

    Hamdioui, S., Fieback, M., Nagarajan, S. & Taouil, M., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE, 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  9. NBTI stress delay sensitivity analysis of reliability enhanced Schmitt trigger based circuits

    Shah, A. P., Vishvakarma, S. K. & Cotofana, S., 1 Nov 2019, In : Microelectronics Reliability. 102, p. 1-8 8 p., 113391.

    Research output: Contribution to journalArticleScientificpeer-review

  10. GASAL2: a GPU accelerated sequence alignment library for high-throughput NGS data

    Ahmed, N., Lévy, J., Ren, S., Mushtaq, H., Bertels, K. & Al-Ars, Z., 25 Oct 2019, In : BMC Bioinformatics. 20, 1, p. 1-20 20 p.

    Research output: Contribution to journalArticleScientificpeer-review

  11. Fletcher: A framework to efficiently integrate FPGA accelerators with apache arrow

    Peltenburg, J., Van Straten, J., Wijtemans, L., Van Leeuwen, L., Al-Ars, Z. & Hofstee, P., 1 Sep 2019, Proceedings - 29th International Conference on Field-Programmable Logic and Applications, FPL 2019. Sourdis, I., Bouganis, C-S., Alvarez, C., Toledo Diaz, L. A., Valero, P. & Martorell, X. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 270-277 8 p. 8892145

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  12. Voltage References for the Ultra-Wide Temperature Range from 4.2K to 300K in 40-nm CMOS

    Van Staveren, J., Garcia Almudever, C., Scappucci, G., Veldhorst, M., Babaie, M., Charbon, E. & Sebastiano, F., 1 Sep 2019, ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference. Institute of Electrical and Electronics Engineers (IEEE), p. 37-40 4 p. 8902861

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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