1. 2019
  2. Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

    Wu, L., Rao, S., Cardoso Medeiros, G., Taouil, M., Marinissen, E. J., Yasin, F., Couet, S., Hamdioui, S. & Kar, G. S., 2019, 2019 IEEE European Test Symposium (ETS): Proceedings. Danvers: IEEE, p. 1-6 6 p. 8791518

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Quantum accelerated computer architectures

    Riesebos, L., Fu, X., Moueddenne, A. A., Lao, L., Varsamopoulos, S., Ashraf, I., Van Someren, J., Khammassi, N., Almudever, C. G. & Bertels, K., 2019, 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings. Yasuura, H., Miyanaga, Y. & Kiya, H. (eds.). Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers Inc., Vol. 2019-May. 4 p. 8702488

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  4. Rebooting Computing: The Challenges for Test and Reliability

    Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K., Vatajelu, E. I., di Natale, G., Anghel, L., Nagarajan, S., Fieback, M. C. R. & Hamdioui, S., 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  5. Rebooting Our Computing Models

    Cadareanu, P., Reddy C, N., Almudever, C. G., Khanna, A., Raychowdhury, A., Bertels, K., Narayanan, V., Di Ventra, M. & Gaillardon, P-E., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, p. 1469-1476 8 p. 8715167

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  6. Refine and recycle: A method to increase decompression parallelism

    Fang, J., Chen, J., Lee, J., Al-Ars, Z. & Hofstee, H. P., 2019, 2019 IEEE 30th International Conference on Application-specific Systems, Architectures and Processors (ASAP): Proceedings. IEEE, p. 272-280 9 p. 8825015

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  7. Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

    Agbo, I., Taouil, M., Kraak, D., Hamdioui, S., Weckx, P., Cosemans, S., Raghavan, P., Catthoor, F. & Dehaene, W., 2019, In : Microelectronics Reliability. 99, p. 52-61 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

  8. Skeleton-based Synthesis Flow for Computation-In-Memory Architectures

    Yu, J., Nane, R., Ashraf, I., Taouil, M., Hamdioui, S., Corporaal, H. & Bertels, K., 2019, (Accepted/In press) In : IEEE Transactions on Emerging Topics in Computing. PP, p. 1-13 13 p.

    Research output: Contribution to journalArticleScientificpeer-review

  9. Software-Based Mitigation for Memory Address Decoder Aging

    Kraak, D., Gursoy, C. C., Agbo, I. O., Taouil, M., Jenihhin, M., Raik, J. & Hamdioui, S., 2019, 2019 IEEE Latin American Test Symposium (LATS). Danvers: IEEE, p. 1-6 6 p. 8704595

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  10. SparkJNI: A Toolchain for Hardware Accelerated Big Data Apache Spark

    Voicu, T. A. & Al-Ars, Z., 2019, 2019 4th IEEE International Conference on Big Data Analytics, ICBDA 2019. Guan, S-U., Zhang, K. & Cao, J. (eds.). Piscataway, NJ, USA: IEEE, p. 152-157 6 p. 8713201

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  11. Sparstition: A partitioning scheme for large-scale sparse matrix vector multiplication on FPGA

    Sigurbergsson, B., Hogervorst, T., Qiu, T. D. & Nane, R., 2019, 2019 IEEE 30th International Conference on Application-specific Systems, Architectures and Processors (ASAP): Proceedings. IEEE, p. 51-58 8 p. 8825125

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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