1. 2019
  2. Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

    Wu, L., Rao, S., Cardoso Medeiros, G., Taouil, M., Marinissen, E. J., Yasin, F., Couet, S., Hamdioui, S. & Kar, G. S., 2019, 2019 IEEE European Test Symposium (ETS): Proceedings. Danvers: IEEE, p. 1-6 6 p. 8791518

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. Quantum Computer Architecture: a full-stack overview

    Bertels, K., Hogaboam, J. W. & Almudever, C. G., 2019, In : Microprocessors and Microsystems. 66, p. 21-66

    Research output: Contribution to journalSpecial issueScientificpeer-review

  4. Quantum accelerated computer architectures

    Riesebos, L., Fu, X., Moueddenne, A. A., Lao, L., Varsamopoulos, S., Ashraf, I., Van Someren, J., Khammassi, N., Almudever, C. G. & Bertels, K., 2019, 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings. Yasuura, H., Miyanaga, Y. & Kiya, H. (eds.). Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), Vol. 2019-May. 4 p. 8702488

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  5. Rebooting Computing: The Challenges for Test and Reliability

    Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K., Vatajelu, E. I., di Natale, G., Anghel, L., Nagarajan, S., Fieback, M. C. R. & Hamdioui, S., 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  6. Rebooting Our Computing Models

    Cadareanu, P., Reddy C, N., Almudever, C. G., Khanna, A., Raychowdhury, A., Bertels, K., Narayanan, V., Di Ventra, M. & Gaillardon, P-E., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, p. 1469-1476 8 p. 8715167

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  7. Refine and recycle: A method to increase decompression parallelism

    Fang, J., Chen, J., Lee, J., Al-Ars, Z. & Hofstee, H. P., 2019, 2019 IEEE 30th International Conference on Application-specific Systems, Architectures and Processors (ASAP): Proceedings. IEEE, p. 272-280 9 p. 8825015

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  8. Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

    Agbo, I., Taouil, M., Kraak, D., Hamdioui, S., Weckx, P., Cosemans, S., Raghavan, P., Catthoor, F. & Dehaene, W., 2019, In : Microelectronics Reliability. 99, p. 52-61 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

  9. Software-Based Mitigation for Memory Address Decoder Aging

    Kraak, D., Gursoy, C. C., Agbo, I. O., Taouil, M., Jenihhin, M., Raik, J. & Hamdioui, S., 2019, 2019 IEEE Latin American Test Symposium (LATS). Danvers: IEEE, p. 1-6 6 p. 8704595

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  10. SparkGA2: Production-quality memory-efficient Apache Spark based genome analysis framework

    Mushtaq, H., Ahmed, N. & Al-Ars, Z., 2019, In : PLoS ONE. 14, 12, p. 1-14 14 p., e0224784.

    Research output: Contribution to journalArticleScientificpeer-review

  11. SparkJNI: A Toolchain for Hardware Accelerated Big Data Apache Spark

    Voicu, T. A. & Al-Ars, Z., 2019, 2019 4th IEEE International Conference on Big Data Analytics, ICBDA 2019. Guan, S-U., Zhang, K. & Cao, J. (eds.). Piscataway, NJ, USA: IEEE, p. 152-157 6 p. 8713201

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  12. Sparstition: A partitioning scheme for large-scale sparse matrix vector multiplication on FPGA

    Sigurbergsson, B., Hogervorst, T., Qiu, T. D. & Nane, R., 2019, 2019 IEEE 30th International Conference on Application-specific Systems, Architectures and Processors (ASAP): Proceedings. IEEE, p. 51-58 8 p. 8825125

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  13. Supporting Columnar In-memory Formats on FPGA: The Hardware Design of Fletcher for Apache Arrow

    Peltenburg, J., van Straten, J., Brobbel, M., Hofstee, H. P. & Al-Ars, Z., 2019, Applied Reconfigurable Computing: 15th International Symposium, ARC 2019, Proceedings. Hochberger, C., Koch, A., Diniz, P., Woods, R. & Nelson, B. (eds.). Cham: Springer, p. 32-47 16 p. (Lecture Notes in Computer Science; vol. 11444 LNCS).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  14. Time-division Multiplexing Automata Processor

    Yu, J., Du Nguyen, H. A., Abu Lebdeh, M., Taouil, M. & Hamdioui, S., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) : Proceedings. IEEE, p. 794-799 6 p. 8715140

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  15. Towards Reliable and Secure Post-Quantum Co-Processors based on RISC-V

    Fritzmann, T., Sharif, U., Müller-Gritschneder, D., Reinbrecht, C., Schlichtmann, U. & Sepulveda, J., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings . IEEE, p. 1148-1153 6 p. 8715173

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  16. Untestable faults identification in GPGPUs for safety-critical applications

    Condia, J. E. R., Da Silva, F. A., Hamdioui, S., Sauer, C. & Reorda, M. S., 2019, 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019. Institute of Electrical and Electronics Engineers (IEEE), p. 570-573 4 p. 8964677

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  17. eQASM: An executable quantum instruction set architecture

    Fu, X., Riesebos, L., Rol, M. A., Van Straten, J., Van Someren, J., Khammassi, N., Ashraf, I., Vermeulen, R. F. L., Newsum, V., Loh, K. K. L., De Sterke, J. C., Vlothuizen, W. J., Schouten, R. N., García Almudever, C., Dicarlo, L. & Bertels, K., 2019, Proceedings - 25th IEEE International Symposium on High Performance Computer Architecture, HPCA 2019. Louri, A. & Venkataramani, G. P. (eds.). Piscataway, NJ: IEEE, p. 224-237 14 p. 8675197

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  18. 2018
  19. A High-Bandwidth Snappy Decompressor in Reconfigurable Logic

    Fang, J., Chen, J., Al-Ars, Z., Hofstee, P. & Hidders, J., 30 Sep 2018, 2018 International Conference on Hardware/Software Codesign and System Synthesis (CODES+ ISSS). IEEE, p. 1-2 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  20. Complementary arranged graphene nanoribbon-based boolean gates

    Jiang, Y., Laurenciu, N. C. & Cotofana, S., 17 Jul 2018, Proceedings of the 14th IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2018. Cotofana, S. & Sirakoulis, G. C. (eds.). New York, NY, USA: Association for Computing Machinery (ACM), p. 51-57 7 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  21. Understanding MPSoCs: Exploiting memory microarchitectural vulnerabilities of high performance NoC-based MPSoCs

    Sepulveda, J., Reinbrecht, C., Azad, S. P., Niazmand, B. & Jervan, G., 15 Jul 2018, Proceedings - 2018 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation, SAMOS 2018. Mudge, T. & Pnevmatikatos, D. N. (eds.). New York: Association for Computing Machinery (ACM), p. 162-166 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  22. Device aging: A reliability and security concern

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Catthoor, F., Chatterjee, A., Singh, A., Wunderlich, H. & Karimi, N., 1 May 2018, 2018 IEEE 23rd European Test Symposium (ETS). p. 1-10 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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