1. 1650μm2 Thermal-Diffusivity Sensors with Inaccuracies Down to ±0.75°C in 40nm CMOS

    Sonmez, U., Sebastiano, F. & Makinwa, K. A. A., 25 Feb 2016, 2016 IEEE International Solid-State Circuits Conference, ISSCC 2016: Digest of Technical Papers. Fujino, L. C. (ed.). Danvers, MA: IEEE, p. 206-207 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  2. A 0.12mm2 Wien-Bridge Temperature Sensor with 0.1°C (3σ) Inaccuracy from -40°C to 180°C

    Pan, S., Gürleyük, Ç., Pimenta, M. F. & Makinwa, K. A. A., 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. van der Spiegel, J. (ed.). Piscataway, NJ: IEEE, Vol. 2019-February. p. 184-186 3 p. 8662457

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. A 0.25 mm²-Resistor-Based Temperature Sensor With an Inaccuracy of 0.12 °C (3σ) From -55 °C to 125 °C

    Pan, S. & Makinwa, K., 2018, In : IEEE Journal of Solid State Circuits. p. 1-9 9 p.

    Research output: Contribution to journalArticleScientificpeer-review

  4. A 0.25mm2 Resistor-Based Temperature Sensor with an Inaccuracy of 0.12°C (3σ) from -55°C to 125°C and a Resolution FOM of 32fJK2

    Pan, S. & Makinwa, K. A. A., 2018, 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018: Digest of technical papers. Fujino, L. J. (ed.). Piscataway, NJ: IEEE, Vol. 61. p. 320-322 3 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  5. A 0.53pJK27000μm2resistor-based temperature sensor with an inaccuracy of ±0.35°C (3σ) in 65nm CMOS

    Choi, W., Lee, Y-T., Kim, S., Lee, S., Jang, J., Chun, J., Makinwa, K. A. A. & Chae, Y., 2018, 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018: Digest of Technical Papers. Fujino, L. C. (ed.). Piscataway, NJ: IEEE, Vol. 61. p. 322-324 3 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  6. A 0.6nm Resolution 19.8mW Eddy-Current Displacement Sensor Interface with 126MHz Excitation

    Chaturvedi, V., Nabavi, M. R., Vogel, J., Makinwa, K. A. A. & Nihtianov, S., 2017, 2017 IEEE International Solid-State Circuits Conference, ISSCC 2017: Digest of Technical Papers. Fujino, L. C. (ed.). Danvers, MA: IEEE, Vol. 60. p. 174-175 2 p. 7870317

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  7. A 1.2V 8.3nJ energy-efficient CMOS humidity sensor for RFID applications

    Tan, Z., Chae, Y., Daamen, R., Humbert, A., Ponomarev, YV. & Pertijs, MAP., 2012, IEEE symposium on VLSI circuits, digest of technical papers. Amerasekera, A. & Nagata, M. (eds.). Piscataway: IEEE Society, p. 24-25 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  8. A 1.65mW 0.16mm² Dynamic Zoom-ADC with 107.5dB DR in 20kHz BW

    Gönen, B., Sebastiano, F., van Veldhoven, R. & Makinwa, K. A. A., 1 Feb 2016, 2016 IEEE International Solid-State Circuits Conference, ISSCC 2016: Digest of Technical Papers. Fujino, L. C. (ed.). Danvers, MA: IEEE, p. 282-283 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  9. A 1.8V 11uW CMOS Smart Humidity Sensor for RFID Sensing Applications

    Tan, Z., Daamen, R., Humbert, A., Souri, K., Chae, Y., Ponomarev, YV. & Pertijs, MAP., 2011, Proceedings of Technical Papers - IEEE 2011 Asian Solid-State Circuits Conference. Ki-Nam, K. & Liu, S-I. (eds.). Piscataway, NJ, USA: IEEE Society, p. 105-108 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  10. A 10kHz-BW 93.7dB-SNR Chopped ΔΣ ADC with 30V Input CM Range and 115dB CMRR at 10kHz

    Xu, L., Huijsing, J. H. & Makinwa, K. A. A., 2017, 2017 IEEE Asian Solid-State Circuits Conference (A-SSCC): Proceedings of Technical Papers. Danvers, MA: IEEE, p. 49-52 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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