1. Conference contribution › Scientific › Peer-reviewed
  2. A 5800-μm2 Resistor-Based Temperature Sensor with a One-Point Trimmed Inaccuracy of ±1.2 °c (3σ) from -50 °c to 105 °c in 65-nm CMOS

    Lee, Y., Choi, W., Kim, T., Song, S., Makinwa, K. A. A. & Chae, Y., 1 Sep 2019, ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference. Institute of Electrical and Electronics Engineers (IEEE), p. 67-70 4 p. 8902650. (IEEE Solid State Circuits Letters; vol. 2, no. 9).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. A 6800-μm2 Resistor-Based Temperature Sensor in 180-nm CMOS

    Angevare, J. & Makinwa, K. A. A., 2018, 2018 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018 - Proceedings. Kuroda, T. (ed.). Institute of Electrical and Electronics Engineers (IEEE), p. 43-46 4 p. 8579332

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  4. A 9.1 mW inductive displacement-to-digital converter with 1.85 nm resolution

    Chaturvedi, V., Vogel, J. G., Makinwa, K. A. A. & Nihtianov, S., 2017, Digest of Technical Papers - 2017 Symposium on VLSI Circuits. Piscataway, NJ: IEEE, p. C80-C81 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  5. A BJT-based Temperature-to-Digital Converter with ±60mK (3σ) Inaccuracy from -70°C to 125°C in 160nm CMOS

    Yousefzadeh, B., Heidary Shalmany, S. & Makinwa, K. A. A., Jun 2016, 2016 IEEE Symposium on VLSI Circuits, VLSI-Circuits 2016: Digest of Technical Papers. Piscataway, NJ: IEEE, p. 1-2 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  6. A BJT-based temperature sensor with a packaging-robust inaccuracy of ±0.3°C (3s) from -55°C to +125°C after heater-assisted voltage calibration

    Yousefzadeh, B. & Makinwa, K. A. A., 2017, 2017 IEEE International Solid-State Circuits Conference, ISSCC 2017: Digest of Technical Papers. Fujino, L. C. (ed.). Danvers, MA: IEEE, Vol. 60. p. 162-163 2 p. 7870311

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  7. A CMOS Dual-RC frequency reference with ±250ppm inaccuracy from -45°C to 85°C

    Gürleyük, Ç., Pedalà, L., Sebastiano, F. & Makinwa, K. A. A., 2018, 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018: Digest of technical papers. Fujino, L. J. (ed.). Piscataway, NJ: IEEE, Vol. 61. p. 54-56 3 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  8. A CMOS Resistor-Based Temperature Sensor with a 10fJ·K2 Resolution FoM and 0.4°C (30) Inaccuracy from -55°C to 125°C after a 1-point Trim

    Pan, S. & Makinwa, K. A. A., 2020, 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020. IEEE, p. 68-70 3 p. 9063064

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  9. A CMOS Temperature Sensor with a 49fJ·K2 Resolution FoM

    Pan, S., Jiang, H. & Makinwa, K. A. A., 2017, Digest of Technical Papers - 2017 Symposium on VLSI Circuits. Piscataway, NJ: IEEE, p. C82-C83 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  10. A Capacitively-Degenerated 100dB Linear 20-150MS/s Dynamic Amplifier

    Akter, S., Makinwa, K. & Bult, K., 2017, Digest of Technical Papers - 2017 Symposium on VLSI Circuits. Piscataway, NJ: IEEE, p. C136-C137 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  11. A Compact Sensor Readout Circuit with Combined Temperature, Capacitance and Voltage Sensing Functionality

    Yousefzadeh, B., Wu, W., Buter, B., Makinwa, K. & Pertijs, M., 2017, Digest of Technical Papers - 2017 Symposium on VLSI Circuits. Piscataway, NJ: IEEE, p. C78-C79 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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