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  1. 2019

  2. A new class of efficient randomized benchmarking protocols

    Helsen, J., Xue, X., Vandersypen, L. M. K. & Wehner, S., 2019, In : NPJ Quantum Information. 5, 1, 9 p., 71.

    Research output: Contribution to journal › Article › Scientific › peer-review

  3. Ab initio exact diagonalization simulation of the Nagaoka transition in quantum dots

    Wang, Y., Dehollain, J. P., Liu, F., Mukhopadhyay, U., Rudner, M. S., Vandersypen, L. M. K. & Demler, E., 2019, In : Physical Review B. 100, 15, 14 p., 155133.

    Research output: Contribution to journal › Article › Scientific › peer-review

  4. Author Correction: Rapid gate-based spin read-out in silicon using an on-chip resonator (Nature Nanotechnology, (2019), 14, 8, (742-746), 10.1038/s41565-019-0488-9)

    Zheng, G., Samkharadze, N., Noordam, M. L., Kalhor, N., Brousse, D., Sammak, A., Scappucci, G. & Vandersypen, L. M. K., 2019, In : Nature Nanotechnology.

    Research output: Contribution to journal › Comment/Letter to the editor › Scientific

  5. Benchmarking Gate Fidelities in a Si/SiGe Two-Qubit Device

    Xue, X., Watson, T. F., Helsen, J., Ward, D. R., Savage, D. E., Lagally, M. G., Coppersmith, S. N., Eriksson, M. A., Wehner, S. & Vandersypen, L. M. K., 2019, In : Physical Review X. 9, 2, 12 p., 021011.

    Research output: Contribution to journal › Article › Scientific › peer-review

  6. Electrode-induced lattice distortions in GaAs multi-quantum-dot arrays

    Pateras, A., Carnis, J., Mukhopadhyay, U., Richard, M. I., Leake, S. J., Schülli, T. U., Reichl, C., Wegscheider, W., Dehollain, J. P., Vandersypen, L. M. K. & Evans, P. G., 2019, In : Journal of Materials Research. 34, 8, p. 1291-1301 11 p.

    Research output: Contribution to journal › Article › Scientific › peer-review

  7. Impact of Classical Control Electronics on Qubit Fidelity

    Van Dijk, J. P. G., Kawakami, E., Schouten, R. N., Veldhorst, M., Vandersypen, L. M. K., Babaie, M., Charbon, E. & Sebastiano, F., 2019, In : Physical Review Applied. 12, 4, 20 p., 044054.

    Research output: Contribution to journal › Article › Scientific › peer-review

  8. Loading a quantum-dot based “Qubyte” register

    Volk, C., Zwerver, A. M. J., Mukhopadhyay, U., Eendebak, P. T., van Diepen, C. J., Dehollain, J. P., Hensgens, T., Fujita, T., Vandersypen, L. M. K. & More Authors, 2019, In : NPJ Quantum Information. 5, 1, 29.

    Research output: Contribution to journal › Article › Scientific › peer-review

  9. Quantum Transport Properties of Industrial Si 28 / Si O2 28

    Sabbagh, D., Massa, L., Amitonov, S. V., Boter, J. M., Droulers, G., Eenink, H. G. J., Veldhorst, M., Vandersypen, L. M. K. & Scappucci, G., 2019, In : Physical Review Applied. 12, 1, 8 p., 014013.

    Research output: Contribution to journal › Article › Scientific › peer-review

  10. Quantum simulation and optimization in hot quantum networks

    Schuetz, M. J. A., Vermersch, B., Kirchmair, G., Vandersypen, L. M. K., Cirac, J. I., Lukin, M. D. & Zoller, P., 2019, In : Physical Review B. 99, 24, 8 p., 241302.

    Research output: Contribution to journal › Article › Scientific › peer-review

  11. Qubit Device Integration Using Advanced Semiconductor Manufacturing Process Technology

    Thomas, N., Watson, T. F., Metz, M., Boter, J. M., Dehollain Lorenzana, J. P., Droulers, G., Eenink, G., Li, R., Massa, L., Sabbagh, D., Samkharadze, N., Volk, C., Zwerver, A. M., Veldhorst, M., Scappucci, G. & Vandersypen, L. M. K., 2019, 2018 IEEE International Electron Devices Meeting, IEDM 2018. Rim, K. (ed.). Institute of Electrical and Electronics Engineers Inc., Vol. 2018-December. p. 6.3.1-6.3.4 8614624

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

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