1. 1998
  2. Two-detector Doppler broadening study of enhancement in Al

    Mijnarends, PE., Kruseman, AC., van Veen, A., Schut, H. & Bansil, A., 1998, In : Journal of Physics: Condensed Matter. 10, p. 10383-10390 8 p.

    Research output: Contribution to journalArticleScientificpeer-review

  3. Veiligheidsaspecten spiegelfilter in bundelbuis R2 van de HOR

    van Well, AA., Bos, AJJ., Labohm, F., Gommers, RM., Gibcus, HPM. & de Haan, VO., 1998, Unknown Publisher. 78 p.

    Research output: Book/ReportReportProfessional

  4. Voorzitter IOOC/IRI

    van Veen, A., 1998

    Research output: Other contributionProfessional

  5. 1997
  6. Characterization of defects at the Si/SiO2 interface of a polysilicon-gated MOS system by monoenergetic positrons

    Clement, M., de Nijs, JMM., Schut, H. & van Veen, A., 1997, In : Materials Science Forum. 255, 257, p. 718-720 3 p.

    Research output: Contribution to journalArticleProfessional

  7. Positron annihilation as a tool for the study of defects in the MOS system

    de Nijs, JMM., Clement, M., Schut, H. & van Veen, A., 1997, In : Microelectronic Engineering. 36, p. 35-42 8 p.

    Research output: Contribution to journalArticleScientificpeer-review

  8. Positron beam analysis of semiconductor materials using a two-detector Coppler broadeing coincidence system

    Kruseman, AC., Schut, H., van Veen, A., Mijnarends, PE., Clement, M. & de Nijs, JMM., 1997, In : Applied Surface Science. 116, p. 192-197 6 p.

    Research output: Contribution to journalArticleScientificpeer-review

  9. Positron beam technique for the study of defects at the Si/SiO2 interface of a polysillicon gated MOS system

    Clement, M., de Nijs, JMM., Schut, H., van Veen, A. & Balk, P., 1997, Mat. Res. Soc. Symp. Proc. 1997. p. 143-148 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  10. Transport of positrons in an electrically biased MOS system

    Clement, M., de Nijs, JMM., Schut, H., van Veen, A. & Balk, P., 1997, In : Journal of Applied Physics. 81, p. 1943-1955 13 p.

    Research output: Contribution to journalArticleScientificpeer-review

  11. 1996
  12. Analysis of positron beam data by combined use of the shape and wing parameters

    Clement, M., de Nijs, JMM., van Veen, A., Schut, H. & Balk, P., 1996, In : Applied Physics Letters. 79, p. 9029-9038 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

  13. 1992
  14. 5f electron localization in UTX compounds

    Havela, L., Sechovský, V., Naegele, J. R., Almeida, T., Brück, E. H., Nakotte, H. & de Boer, F. R., 2 Feb 1992, In : Journal of Magnetism and Magnetic Materials. 104-107, PART 1, p. 23-24 2 p.

    Research output: Contribution to journalArticleScientificpeer-review

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