1. 2020
  2. In-Pixel temperature sensors with an accuracy of ±0.25 °C, a 3σ variation of ±0.7 °C in the spatial domain and a 3σ variation of ±1 °C in the temporal domain

    Abarca, A. & Theuwissen, A., Jul 2020, In : Micromachines. 11, 7, 16 p., 665.

    Research output: Contribution to journalArticleScientificpeer-review

  3. A CMOS Image Sensor with Thermal Sensing Capability and Column Zoom ADCs

    Xie, S. & Theuwissen, A. J. P., 1 Mar 2020, In : IEEE Sensors Journal. 20, 5, p. 2398-2404 7 p., 8905785.

    Research output: Contribution to journalArticleScientificpeer-review

  4. A 10 bit 5 MS/s column SAR ADC with digital error correction for CMOS image sensors

    Xie, S. & Theuwissen, A., 2020, In : IEEE Transactions on Circuits and Systems II: Express Briefs. 67, 6, p. 984 - 988 5 p., 8759916.

    Research output: Contribution to journalArticleScientificpeer-review

  5. A CMOS image sensor with a 10 ​MHz column readout speed using digitally calibrated pipelined ADCs

    Xie, S. & Theuwissen, A., 2020, In : Microelectronics Journal. 99, p. 1-7 7 p., 104758.

    Research output: Contribution to journalArticleScientificpeer-review

  6. A CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation

    Xie, S., Abarca Prouza, A. & Theuwissen, A., 2020, In : IEEE Transactions on Circuits and Systems II: Express Briefs. 67, 2, p. 255 - 259 5 p., 8704909.

    Research output: Contribution to journalArticleScientificpeer-review

  7. 2019
  8. All-MOS self-referenced temperature sensor

    Xie, S. & Theuwissen, A., 19 Sep 2019, In : Electronics Letters. 55, 19, p. 1045-1047 3 p.

    Research output: Contribution to journalArticleScientificpeer-review

  9. A CMOS image sensor with improved readout speed using column SAR ADC with digital error correction

    Xie, S. & Theuwissen, A., 2019, 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings. Institute of Electrical and Electronics Engineers (IEEE), Vol. 2019-May. p. 1-5 5 p. 8702292

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  10. Compensation for Process and Temperature Dependency in a CMOS Image Sensor

    Xie, S. & Theuwissen, A., 2019, In : Sensors (Switzerland). 19, 4, p. 1-15 15 p., 870.

    Research output: Contribution to journalArticleScientificpeer-review

  11. On-Chip Smart Temperature Sensors for Dark Current Compensation in CMOS Image Sensors

    Xie, S. & Theuwissen, A. J. P., 2019, In : IEEE Sensors Journal. 19, 18, p. 7849-7860 12 p., 8723532.

    Research output: Contribution to journalArticleScientificpeer-review

  12. Pixel Optimizations and Digital Calibration Methods of a CMOS Image Sensor Targeting High Linearity

    Wang, F. & Theuwissen, A. J. P., 2019, In : IEEE Transactions on Circuits and Systems I: Regular Papers. 66, 3, p. 930-940 11 p., 8490722.

    Research output: Contribution to journalArticleScientificpeer-review

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