Research output

  1. A TRL Error-box Split Procedure to Compensate for the Bias Dependency Effects in Device Test-Fixtures

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  2. Direct mm-Wave On-Wafer Power Calibration Employing CMOS as a Transfer Device

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. On the Impact of Radiation Losses in TRL Calibrations

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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ID: 174399