Research output

  1. Mitigation of Sense Amplifier Degradation Using Skewed Design

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  2. ESRAM Reliability: Why is it still not optimally solved?

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

    Research output: Contribution to journalArticleScientificpeer-review

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ID: 195991