Research output

  1. Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

    Research output: Contribution to journalArticleScientificpeer-review

  2. Hardware-based aging mitigation scheme for memory address decoder

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Methodology for Application-Dependent Degradation Analysis of Memory Timing

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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ID: 195991