Research output

  1. Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

    Research output: Contribution to journalArticleScientificpeer-review

  2. Methodology for Application-Dependent Degradation Analysis of Memory Timing

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

    Research output: Contribution to journalArticleScientificpeer-review

View all (10) »

ID: 195991