Research output

  1. Device aging: A reliability and security concern

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  2. Degradation analysis of high performance 14nm FinFET SRAM

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Impact and mitigation of SRAM read path aging

    Research output: Contribution to journalArticleScientificpeer-review

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ID: 195991