1. 2020
  2. Mitigation of Sense Amplifier Degradation Using Skewed Design

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., Mar 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 1614-1617 4 p. 9116532. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. ESRAM Reliability: Why is it still not optimally solved?

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9081145

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  4. 2019
  5. Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

    Kraak, D., Taouil, M., Agbo, I., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 1 Jun 2019, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27, 6, p. 1308-1321 14 p., 8678671.

    Research output: Contribution to journalArticleScientificpeer-review

  6. Hardware-based aging mitigation scheme for memory address decoder

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 IEEE European Test Symposium (ETS). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  7. Methodology for Application-Dependent Degradation Analysis of Memory Timing

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, p. 162-167 6 p. 8715143

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  8. Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

    Agbo, I., Taouil, M., Kraak, D., Hamdioui, S., Weckx, P., Cosemans, S., Raghavan, P., Catthoor, F. & Dehaene, W., 2019, In : Microelectronics Reliability. 99, p. 52-61 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

  9. Software-Based Mitigation for Memory Address Decoder Aging

    Kraak, D., Gursoy, C. C., Agbo, I. O., Taouil, M., Jenihhin, M., Raik, J. & Hamdioui, S., 2019, 2019 IEEE Latin American Test Symposium (LATS). Danvers: IEEE, p. 1-6 6 p. 8704595

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  10. 2018
  11. Device aging: A reliability and security concern

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Catthoor, F., Chatterjee, A., Singh, A., Wunderlich, H. & Karimi, N., 1 May 2018, 2018 IEEE 23rd European Test Symposium (ETS). p. 1-10 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  12. Degradation analysis of high performance 14nm FinFET SRAM

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 1 Mar 2018, 2018 Design, Automation Test in Europe Conference Exhibition (DATE). p. 201-206 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  13. Impact and mitigation of SRAM read path aging

    Agbo, I., Taouil, M., Kraak, D., Hamdioui, S., Weckx, P., Cosemans, S., Catthoor, F. & Dehaene, W., 2018, In : Microelectronics Reliability. 87, p. 158-167 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

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