Research output

  1. A TRL Error-box Split Procedure to Compensate for the Bias Dependency Effects in Device Test-Fixtures

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  2. High Resolution Passive THz Imaging Array with Polarization Reusage in 22nm CMOS

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Wideband single pixel radiometer in 28 nm CMOS technology for low-cost imaging applications

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

View all (12) »

ID: 151957