Research output

  1. A TRL Error-box Split Procedure to Compensate for the Bias Dependency Effects in Device Test-Fixtures

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  2. High Resolution Passive THz Imaging Array with Polarization Reusage in 22nm CMOS

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. Direct mm-Wave On-Wafer Power Calibration Employing CMOS as a Transfer Device

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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