Research output

  1. Defect and Fault Modeling Framework for STT-MRAM Testing

    Research output: Contribution to journalArticleScientificpeer-review

  2. Device-Aware Test: A New Test Approach Towards DPPB Level

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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