Research output

  1. Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  2. Defect and Fault Modeling Framework for STT-MRAM Testing

    Research output: Contribution to journalArticleScientificpeer-review

  3. Device-Aware Test: A New Test Approach Towards DPPB Level

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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ID: 31439288