Research output

  1. DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

    Research output: Contribution to conferenceOtherOther research output

  2. A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs

    Research output: Contribution to journalArticleScientificpeer-review

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ID: 31439288