1. 2018
  2. A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs

    Medeiros, G. C., Bolzani Poehls, L. M., Taouil, M., Luis Vargas, F. & Hamdioui, S., 2018, In : Microelectronics Reliability. 88-90, p. 355-359 5 p.

    Research output: Contribution to journalArticleScientificpeer-review

ID: 31439288