1. 2019
  2. DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

    Cardoso Medeiros, G., Taouil, M., Fieback, M., Bolzani Poehls, L. M. & Hamdioui, S., 2019, Proceedings - 2019 IEEE European Test Symposium, ETS 2019: Proceedings. IEEE, Vol. 2019-May. p. 1-2 2 p. 8791517

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

    Wu, L., Rao, S., Cardoso Medeiros, G., Taouil, M., Marinissen, E. J., Yasin, F., Couet, S., Hamdioui, S. & Kar, G. S., 2019, 2019 IEEE European Test Symposium (ETS): Proceedings. Danvers: IEEE, p. 1-6 6 p. 8791518

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  4. 2018
  5. A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs

    Medeiros, G. C., Bolzani Poehls, L. M., Taouil, M., Luis Vargas, F. & Hamdioui, S., 2018, In : Microelectronics Reliability. 88-90, p. 355-359 5 p.

    Research output: Contribution to journalArticleScientificpeer-review

ID: 31439288