1. The chemical-mechanical relationship of the SiOC(H) dielectric film

    Yuan, CA., van der Sluis, O., Zhang, GQ., Ernst, LJ., van Driel, WD., van Silfhout, RBR. & Thijsse, BJ., 2007, EuroSimE 2007. Ernst, LJ. (ed.). London: EuroSimE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  2. The effects of graphene stacking on the performance of methane sensor: A first-principles study on the adsorption, band gap and doping of graphene

    Yang, N., Yang, D., Zhang, G., Chen, L., Liu, D., Cai, M. & Fan, X., 2018, In : Sensors. 18, 2, p. 1+13 13 p., 422.

    Research output: Contribution to journalArticleScientificpeer-review

  3. The interface adhesion of CaAlSiN3: Eu2+ phosphor/silicone used in light-emitting diode packaging: A first principles study

    Cui, Z., Fan, J., van Ginkel, H. J., Fan, X. & Zhang, G., 30 Apr 2020, In : Applied Surface Science. 510, 8 p., 145251.

    Research output: Contribution to journalArticleScientificpeer-review

  4. The mechanical influence of the porosity and nano-scale pore size effect of the SiOC(H) dielectric film

    Yuan, CA., Flower, AE., van der Sluis, O., Zhang, GQ., Ernst, LJ., Cherkaoui, M. & van Driel, WD., 2008, Proceedings of the 9th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems. Ernst, L.J., Zhang, G.Q., Driel, W.D. van, Rodgers, P. & Saint Leger, O. de (eds.). Freiburg-im-Breisgau: EuroSimE, p. 199-203 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  5. The mechanical influence of the porosity and nano-scale pore size effect of the SiOC(H) dielectric film

    Yuan, CA., Flower, AE., van der Sluis, O., Zhang, GQ., Ernst, LJ., Cherkaoui, M. & van Driel, WD., 2008, Proceedings of EuroSimE 2008. Ernst, LJ., Zhang, GQ., van Driel, WD., Rodgers, P. & de Saint Leger, O. (eds.). Freiburg: IEEE Society, p. 27-30 4 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  6. The need for multi-scale approaches in Cu/low-k reliability issues

    Yuan, CA., van der Sluis, O., van Driel, WD. & Zhang, GQ., 2008, In : Microelectronics Reliability. 48, p. 833-842 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

  7. The paradigm of ¿More than Moore¿

    Zhang, GQ., van Roosmalen, F., Li, Q. & Graef, M., 2005, Proceedings of 2005 6th International Conference on Electronic Packaging Technology. Keyun, Bi, Chunqing & Wang (eds.). Piscataway, New Jersey: IEEE Society, p. 17-24 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  8. The performance of sintered nanocopper interconnections for high temperature device

    Liu, Q., Chen, X., Zhu, J., Zhang, H., Zhang, J. S., Zhang, J. G., Wang, L., Ye, H., Koh, S. W. & Zhang, G. O., 2018, Proceedings - 2018 19th International Conference on Electronic Packaging Technology, ICEPT 2018. Xiao, F., Wang, J., Chen, L. & Ye, T. (eds.). Piscataway, NJ: IEEE, p. 1476-1478 3 p. 8480591

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  9. The prediction of the mechanical stiffness of the silicon based crystalline/amorphous nano-structures using molecular dynamic (MD) simulation

    Yuan, CA., van der Sluis, O., Zhang, GQ., Ernst, LJ., van Driel, WD. & van Silfhout, RBR., 2007, NanoTech 2007. Laudon, M. (ed.). Santa Clara, CA, USA: NanoTech, p. 1-4 4 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  10. Theory of aluminum metallization corrosion in microelectronics

    van Soestbergen, M., Mavinkurve, A., Rongen, RTH., Jansen, KMB., Ernst, LJ. & Zhang, GQ., 2010, In : Electrochimica Acta. 55, p. 5459-5469 11 p.

    Research output: Contribution to journalArticleScientificpeer-review

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