1. Continuous shock-free termination of atrial fibrillation by local optogenetic therapy and arrhythmia-triggered activation of an implanted light source

    Nyns, E. C. A., Poelma, R. H., Volkers, L., Bart, C. L., van Brakel, T. J., Zeppenfeld, K., Schalij, M. J., Zhang, G. Q., de Vries, A. A. F. & Pijnappels, D. A., 2019, In : EUROPEAN HEART JOURNAL. 40, Supplement 1, p. 1265-1265 1 p.

    Research output: Contribution to journalMeeting AbstractScientific

  2. Correlating Drop Impact Simulations With Drop Impact Testing Using High-Speed Camera Measurements

    Zaal, JJM., van Driel, WD., Kessels, FJHG. & Zhang, GQ., 2009, In : Journal of Electronic Packaging. 131, 011007, p. 1-9 9 p.

    Research output: Contribution to journalArticleScientificpeer-review

  3. Correlating Drop Impact Simulations with Drop Impact Testing using High-Speed Camera Measurements

    Zaal, JJM., van Driel, WD., Kessels, FJHG. & Zhang, GQ., 2008, Proceedings of the 9th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems. Ernst, L.J., Zhang, G.Q., Driel, W.D. van, Rodgers, P. & Saint Leger, O. de (eds.). Freiburg-im-Breisgau: EuroSimE, p. 567-572 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  4. Correlation between chemistry of polymer building blocks and microelectronics reliability

    Bressers, HJL., van Driel, WD., Jansen, KMB., Ernst, LJ. & Zhang, GQ., 2007, In : Microelectronics Reliability. 47, p. 290-294 5 p.

    Research output: Contribution to journalArticleScientificpeer-review

  5. Correlation of activation energy between LEDs and luminaires in the lumen depreciation test

    Lu, G., Yuan, C., Fan, X. & Zhang, GQ., 2014, Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems. s.n. (ed.). Piscataway, NJ, USA: IEEE Society, p. 1-3 3 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  6. Degradation Mechanism Decoupling of Mid-Power White-Light LEDs by SPD Simulation

    Huang, J., Golubović, D. S., Koh, S., Yang, D., Li, X., Fan, X. & Zhang, G. Q., 2016, In : IEEE Transactions on Electron Devices. 63, 7, p. 2807-2814 8 p.

    Research output: Contribution to journalArticleScientificpeer-review

  7. Degradation Mechanisms in LED Packages

    Koh, S., van Driel, W., Yuan, C. & Zhang, G. Q., Jul 2013, Solid State Lighting Reliability. van Driel, W. D. & Fan, X. J. (eds.). New York: Springer, p. 185-205 20 p. (Solid State Lighting Technology and Application Series; vol. 1).

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

  8. Degradation Prediction of Electronic Packages using Machine Learning

    Prisacaru, A., Guerrero, E. O., Gromala, P. J., Han, B. & Zhang, G. Q., 2019, 2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019. IEEE, p. 1-9 9 p. 8724523

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  9. Degradation mechanisms of mid-power white-light LEDs under high-temperature-humidity conditions

    Huang, J., Golubovic, DS., Koh, SW., Yang, D., Li, X., Fan, X. & Zhang, GQ., 2015, In : IEEE Transactions on Device and Materials Reliability. 15, 2, p. 220-228 9 p.

    Research output: Contribution to journalArticleScientificpeer-review

  10. Degradation modeling of mid-power white-light LEDs by using Wiener process

    Huang, J., Golubovi¿, DS., Koh, S., Yang, D., Li, X., Fan, X. & Zhang, GQ., 2015, In : Optics Express. 23, 15, p. A966-A978

    Research output: Contribution to journalArticleScientificpeer-review

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