Research output

  1. Automated Fault Diagnosis in Embedded Systems

    Research output: Scientific - peer-reviewConference contribution

  2. A Model-Based Approach to Sequential Fault Diagnosis

    Research output: Scientific - peer-reviewArticle

  3. Benefits and Costs of Model-Based Fault Diagnosis for Semiconductor Manufacturing Equipment

    Research output: Scientific - peer-reviewConference contribution

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Activities

  1. Automated fault diagnosis in embedded systems

    Activity: Talk or presentationTalk or presentation at a workshop, seminar, course or other meeting

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ID: 301320