1. 2018
  2. Electrical Modeling of STT-MRAM Defects

    Wu, L., Taouil, M., Rao, S., Marinissen, E. J. & Hamdioui, S., 2018, International Test Conference - Proceedings. Piscataway, NJ: IEEE, p. 1-10 10 p. 3.2

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

ID: 7219930