Research output

  1. Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  2. A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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