Research output

  1. Defect and Fault Modeling Framework for STT-MRAM Testing

    Research output: Contribution to journalArticleScientificpeer-review

  2. Device-Aware Test: A New Test Approach Towards DPPB Level

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. Testing Computation-in-Memory Architectures Based on Emerging Memories

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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ID: 38394779