Research output

  1. DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

    Research output: Contribution to conferenceOtherOther research output

  2. Ionizing radiation modeling in DRAM transistors

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Testing Resistive Memories: Where Are We and What Is Missing?

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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