Research output

  1. DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  2. Rebooting Computing: The Challenges for Test and Reliability

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Ionizing radiation modeling in DRAM transistors

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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