1. 2018
  2. Ionizing radiation modeling in DRAM transistors

    Fieback, M., Taouil, M., Hamdioui, S. & Rovatti, M., 2018, 2018 IEEE 19th Latin-American Test Symposium, LATS 2018. IEEE, Vol. 2018-January. p. 1-6 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Testing Resistive Memories: Where Are We and What Is Missing?

    Fieback, M., Taouil, M. & Hamdioui, S., 2018, International Test Conference 2018 - Proceedings. Piscataway, NJ: IEEE, p. 1-9 9 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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