Research output

  1. TPI for improving PR fault coverage of Boolean and three-state circuits

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  2. Test point insertion to improve BIST performance and to reduce ATPG test time and data volume

    Research output: ThesisDissertation (TU Delft)Scientific

  3. Test point insertion that facilitates ATPG in reducing test time and data volume

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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ID: 298333