1. 2016
  2. Error Correction Code protected Data Processing Units

    Cucu Laurenciu, N., Gupta, T., Savin, V. & Cotofana, S., 2016, 2016 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH). Zhao, W. & Moritz, C. A. (eds.). New York: Association for Computing Machinery (ACM), p. 37-42 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. 2015
  4. Low cost and energy, thermal noise driven, probability modulated random number generator

    Cucu Laurenciu, N. & Cotofana, SD., 2015, Proceedings - 2015 IEEE International Symposium on Circuits and Systems. de Medeiras Silva, M. (ed.). Piscataway, NJ, USA: IEEE Society, p. 2724-2727 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  5. 2014
  6. Critical transistors nexus based circuit-level aging assessment and prediction

    Cucu Laurenciu, N. & Cotofana, SD., 2014, In : Journal of Parallel and Distributed Computing. 74, 6, p. 2512-2520 9 p.

    Research output: Contribution to journalArticleScientificpeer-review

  7. 2013
  8. A direct measurement scheme of amalgamated aging effects with novel on-chip sensor

    Cucu Laurenciu, N. & Cotofana, SD., 2013, 21st IFIP/IEEE international conference on very large scale integration. s.n. (ed.). Piscataway: IEEE Society, p. 1-6 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  9. A nonlinear degradation path dependent end-of-life estimation framework from noisy observations

    Cucu Laurenciu, N. & Cotofana, SD., 2013, In : Microelectronics Reliability. 53, 9-11, p. 1213-1217 5 p.

    Research output: Contribution to journalArticleScientificpeer-review

  10. 2012
  11. A Markovian, variation-aware circuit-level aging model

    Cucu Laurenciu, N. & Cotofana, SD., 2012, International symposium on nanoscale architectures. s.n. (ed.). New York: IEEE Society, p. 1-7 7 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  12. Context aware slope based transistor-level aging model

    Cucu Laurenciu, N. & Cotofana, SD., 2012, In : Microelectronics Reliability. 52, 9-10, p. 1-6 6 p.

    Research output: Contribution to journalArticleScientificpeer-review

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