1. 2018
  2. Degradation analysis of high performance 14nm FinFET SRAM

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 1 Mar 2018, 2018 Design, Automation Test in Europe Conference Exhibition (DATE). p. 201-206 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Impact and mitigation of SRAM read path aging

    Agbo, I., Taouil, M., Kraak, D., Hamdioui, S., Weckx, P., Cosemans, S., Catthoor, F. & Dehaene, W., 2018, In : Microelectronics Reliability. 87, p. 158-167 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

  4. Reliability Modeling and Mitigation for Embedded Memories

    Agbo, I., 2018, 137 p.

    Research output: ThesisDissertation (TU Delft)Scientific

  5. 2017
  6. Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads

    Kraak, D., Taouil, M., Agbo, I., Hamdioui, S., Weckx, P., Catthoor, F. & Cosemans, S., 2017, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25, 12, p. 3464-3472 9 p.

    Research output: Contribution to journalArticleScientificpeer-review

  7. Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier

    Agbo, I., Taouil, M., Kraak, D., Hamdioui, S., Kükner, H., Weckx, P., Raghavan, P. & Catthoor, F., 2017, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25, 4, p. 1444-1454 11 p., 7819518.

    Research output: Contribution to journalArticleScientificpeer-review

  8. Mitigation of sense amplifier degradation using input switching

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., Catthoor, F. & Dehaene, W., 2017, Proceedings of the 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, p. 858-863 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  9. 2016
  10. Comparative BTI Analysis for Various Sense Amplifier Designs

    Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., Raghavan, P. & Catthoor, F., 2016, Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016. IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  11. Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability

    Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., Raghavan, P., Catthoor, F. & Dehaene, W., 2016, Proceedings - IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2016). Taskin, B. & Ghosal, P. (eds.). Los Alamitos, CA: IEEE, p. 725-730 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  12. Read Path Degradation Analysis in SRAM

    Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., Catthoor, F. & Dehaene, W., 2016, Proceedings - 21st IEEE European Test Symposium, ETS 2016. Danvers, MA: IEEE, p. 1-2 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  13. 2015
  14. BTI analysis of SRAM write driver

    Agbo, IO., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2015, Proceedings of the 10th International Design and Test Symposium, IDT 2015. Kurdahi, F., Mir, S. & Yu, MO. (eds.). Piscataway: IEEE Society, p. 100-105 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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