1. 2019
  2. Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

    Kraak, D., Taouil, M., Agbo, I., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 1 Jun 2019, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27, 6, p. 1308-1321 14 p., 8678671.

    Research output: Contribution to journalArticleScientificpeer-review

  3. Methodology for Application-Dependent Degradation Analysis of Memory Timing

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, p. 162-167 6 p. 8715143

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  4. Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

    Agbo, I., Taouil, M., Kraak, D., Hamdioui, S., Weckx, P., Cosemans, S., Raghavan, P., Catthoor, F. & Dehaene, W., 2019, In : Microelectronics Reliability. 99, p. 52-61 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

  5. Software-Based Mitigation for Memory Address Decoder Aging

    Kraak, D., Gursoy, C. C., Agbo, I. O., Taouil, M., Jenihhin, M., Raik, J. & Hamdioui, S., 2019, 2019 IEEE Latin American Test Symposium (LATS). Danvers: IEEE, p. 1-6 6 p. 8704595

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  6. 2018
  7. Degradation analysis of high performance 14nm FinFET SRAM

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 1 Mar 2018, 2018 Design, Automation Test in Europe Conference Exhibition (DATE). p. 201-206 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  8. Impact and mitigation of SRAM read path aging

    Agbo, I., Taouil, M., Kraak, D., Hamdioui, S., Weckx, P., Cosemans, S., Catthoor, F. & Dehaene, W., 2018, In : Microelectronics Reliability. 87, p. 158-167 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

  9. Reliability Modeling and Mitigation for Embedded Memories

    Agbo, I., 2018, 137 p.

    Research output: ThesisDissertation (TU Delft)Scientific

  10. 2017
  11. Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads

    Kraak, D., Taouil, M., Agbo, I., Hamdioui, S., Weckx, P., Catthoor, F. & Cosemans, S., 2017, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25, 12, p. 3464-3472 9 p.

    Research output: Contribution to journalArticleScientificpeer-review

  12. Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier

    Agbo, I., Taouil, M., Kraak, D., Hamdioui, S., Kükner, H., Weckx, P., Raghavan, P. & Catthoor, F., 2017, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25, 4, p. 1444-1454 11 p., 7819518.

    Research output: Contribution to journalArticleScientificpeer-review

  13. Mitigation of sense amplifier degradation using input switching

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., Catthoor, F. & Dehaene, W., 2017, Proceedings of the 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, p. 858-863 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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