Research output

  1. A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3-D-Stacked CMOS Technology

    Research output: Contribution to journalArticleScientificpeer-review

  2. A Hybrid Readout Solution for GaN-Based Detectors Using CMOS Technology

    Research output: Contribution to journalArticleScientificpeer-review

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ID: 13310944