1. 2002
  2. A new sharpness measure based on Gaussian lines and edges

    Dijk, J., van Ginkel, M., van Asselt, RJ., van Vliet, LJ. & Verbeek, PW., 2002, Proceedings ASCI 2002. Deprettere, EF., Belloum, A., Heijnsdijk, JWJ. & van der Stappen, F. (eds.). Delft: ASCI, p. 39-43 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. Curvature Estimation of Surfaces in 3D Grey-Value Images

    Rieger, B., Timmermans, FJ., van Vliet, LJ. & Verbeek, PW., 2002, ICPR16, Proceedings. Kasturi, R., Laurendeau, D. & Suen, C. (eds.). Los Alamitos, CA: IEEE, p. 684-687 4 p. (International Conference on Pattern Recognition; vol. 1).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  4. Kwaliteitsmaten voor de perceptie van drukwerk

    Dijk, J., Young, IT. & Verbeek, PW., 2002, s.l.: s.n. 8 p.

    Research output: Book/ReportReportProfessional

  5. The Effect of Gamma and Chroma on the Perception of Color Images

    Dijk, J., Verbeek, PW., Walraven, J. & Young, IT., 2002, CGIV'2002, Proceedings. Fernandez-Maloigne, C. & Schettini, R. (eds.). Springfield, VA, USA: IS&T - Soc. for Imaging Science and Technology, p. 175-180 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  6. The PSD Transfer Function

    de Bakker, M., Verbeek, PW., Steenvoorden, GK. & Young, IT., 2002, In : IEEE Transactions on Electron Devices. 49, 1, p. 202-206 5 p.

    Research output: Contribution to journalArticleScientificpeer-review

  7. 2001
  8. Advanced texture segmentation of 2D and 3D subsurface images

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 2001, s.l.: s.n. 9 p.

    Research output: Book/ReportReportProfessional

  9. Advanced texture segmentation of 2D and 3D subsurface images

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 2001, s.l.: s.n. 6 p.

    Research output: Book/ReportReportProfessional

  10. Analysis and detection of 3D curvilinear structures.

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 2001, Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging.. Lagendijk, RL., Heijnsdijk, JWJ., Pimentel, AD. & Wilkinson, MHF. (eds.). Delft: ASCI, p. 35-40 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  11. Applications of Image Analysis in Orientation Space.

    van Ginkel, M., van Vliet, LJ. & Verbeek, PW., 2001, Fourth Quinquennial Review 1996-2001 Dutch Society for Pattern Recognition and Image Processing.. Vossepoel, AM. & Vos, FM. (eds.). Delft: NVPHBV, p. 355-370 16 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

  12. Borehole Imaging

    van Ginkel, M., Kraaijveld, MA., Reding, E., Verbeek, PW. & van Vliet, LJ., 2001, IPC No. A1, Patent No. PCT/IPN WO 01/84187, Priority date 8 Nov 2001

    Research output: Patent

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