1. 2000
  2. Advanced texture segmentation of 2D and 3D subsurface images.

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 2000, Delft: Delft University of Technology. 8 p.

    Research output: Book/ReportReportProfessional

  3. Finding and describing 3D landmarks by scale adaptive methods.

    de Vries, G. & Verbeek, PW., 2000, Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging. van Vliet, LJ., Heijnsdijk, JWJ., Kielman, T. & Knijnenburg, PMW. (eds.). Delft: ASCI, p. 302-306 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  4. Quality measures for printed material-7.

    Dijk, J., Young, IT., Verbeek, PW. & Walraven, JC., 2000, Delft: Delft University of Technology. 7 p.

    Research output: Book/ReportReportProfessional

  5. Quality measures for printed material-8.

    Dijk, J., Young, IT., Verbeek, PW. & Walraven, JC., 2000, Delft: Delft University of Technology. 8 p.

    Research output: Book/ReportReportProfessional

  6. Robust Curvature Estimation by Finding Optimal Circular Segments in Orientation Space.

    van Ginkel, M., van Vliet, LJ. & Verbeek, PW., 2000, Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging. van Vliet, LJ., Heijnsdijk, JWJ., Kielman, T. & Knijnenburg, PMW. (eds.). Delft: ASCI, p. 53-58 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  7. Scale-adaptive landmark detection, classification and size estimation in 3D object-background images.

    de Vries, G. & Verbeek, PW., 2000, ICPR15, Proc. 15th Int. Conference on Pattern Recognition. Sanfeliu, A., Villanueva, JJ., Vanrell, M., Alquezar, R., Jain, AK. & Kittler, J. (eds.). Los Alamitos: IEEE, p. 1026-1029 4 p. (International Conference on Pattern Recognition; vol. 3).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  8. Smart PSD-array for sheet of light range imaging.

    de Bakker, M., Verbeek, PW. & Steenvoorden, GK., 2000, Sensors and Cameras Systems for Scientific, Industrial and Digital Photography Applications (Proc. Electronic Imaging 2000). Blouke, MM., Williams, GM., Sampat, N. & Yeh, T. (eds.). p. 21-32 12 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  9. The effect of gamma on the perception of printed color images.

    Dijk, J., Verbeek, PW., Walraven, JC. & Young, IT., 2000, Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging. van Vliet, LJ., Heijnsdijk, JWJ., Kielman, T. & Knijnenburg, PMW. (eds.). Delft: ASCI, p. 45-52 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  10. The effect of gamma on the perception of printed color images.

    Dijk, J., Verbeek, PW., Walraven, JC. & Young, IT., 2000, Proc. 1st Int. Conf. Color in Graphics and Image Processing. p. 7-12 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  11. 1999
  12. A new measure for the effect of sharpening and smoothing filters on images

    Dijk, J., de Ridder, D., Verbeek, PW., Walraven, J., Young, IT. & van Vliet, LJ., 1999, SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis. Ersboll, BK. & Johansen, P. (eds.). Lyngby: Pattern Recognition Society of Denmark, p. 213-220 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

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