1. 2011
  2. A bound for the range of a narrow light beam in the near field

    Verbeek, PW. & van den Berg, PM., 2011, In : Journal of the Optical Society of America A: Optics and Image Science, and Vision. 28, 10, p. 2176-2186 11 p.

    Research output: Contribution to journalArticleScientificpeer-review

  3. Continuous orientation representation for arbitrary dimensions - a generalized Knutsson mapping

    Rieger, B., van Vliet, LJ. & Verbeek, PW., 2011, In : Lecture Notes in Computer Science. 6688, p. 744-783 40 p.

    Research output: Contribution to journalArticleScientificpeer-review

  4. 2009
  5. On alphabetic presentations of Clifford algebras and their possible applications

    Toppan, F. & Verbeek, PW., 2009, In : Journal of Mathematical Physics. 50, 123523, p. 1-11 11 p.

    Research output: Contribution to journalArticleScientificpeer-review

  6. 2006
  7. Borehole Imaging

    van Ginkel, M., Kraaijveld, MA., Reding, E., Verbeek, PW. & van Vliet, LJ., 2006, IPC No. Aanvrager: Shell Oil Company, Houston, TX (US), Patent No. US 7,136,510, Priority date 14 Nov 2006

    Research output: Patent

  8. Lightness filtering in color images with respect to the gamut

    Dijk, J. & Verbeek, PW., 2006, Proceedings third european conference on color in graphics, imaging and vision, CGIV 2006. Gevers, T. & Ripamonti, C. (eds.). Leeds: University of Leeds, p. 330-335 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  9. The generalized Radon transform: sampling, accuracy and memory considerations

    Luengo Hendriks, CL., van Ginkel, M., Verbeek, PW. & van Vliet, LJ., 2006, In : Pattern Recognition. 38, 12, p. 2494-2505 12 p.

    Research output: Contribution to journalArticleScientificpeer-review

  10. 2005
  11. Method for transforming a colour image

    Verbeek, PW. & Dijk, J., 2005, IPC No. Aangevraagd, Patent No. US2005002046, Priority date 6 Jan 2005

    Research output: Patent

  12. 2004
  13. On curvature estimation of iso-surfaces in 3D gray-value images and the computation of shape descriptors

    Rieger, B., Timmermans, F. J., van Vliet, LJ. & Verbeek, PW., 2004, In : IEEE Transactions on Pattern Analysis and Machine Intelligence. 26, 8, p. 1088-1094 7 p.

    Research output: Contribution to journalArticleScientificpeer-review

  14. Quantitative Imaging: How to Measure Size Features in Digitized Images

    van Vliet, LJ., Verbeek, PW. & Young, IT., 2004, Proc. IEEE Int. Symposium on Biomedical Imaging: From Nano to Macro. Denney, T. (ed.). Piscataway: IEEE Press, p. 1227-1230 4 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  15. Toward the development of a three-dimensional midfield microscope

    Garini, Y., Kutchoukov, VG., Bossche, A., Alkemade, PFA., Docter, MW., Verbeek, PW., van Vliet, LJ. & Young, IT., 2004, In : Proceedings of SPIE- International Society for Optical Engineering. 5327, p. 115-122 8 p.

    Research output: Contribution to journalConference articleScientificpeer-review

  16. Werkwijze voor het bewerken van een kleurenbeeld

    Verbeek, PW. & Dijk, J., 2004, IPC No. Aanvrager: TU Delft OCT-01-012, Patent No. NL1022258, Priority date 25 Jun 2004

    Research output: Patent

  17. 2003
  18. A new sharpness measure based on Gaussian lines and edges

    Dijk, J., van Ginkel, M., van Asselt, RJ., van Vliet, LJ. & Verbeek, PW., 2003, In : Lecture Notes in Computer Science. 2756, p. 149-156 8 p.

    Research output: Contribution to journalArticleScientificpeer-review

  19. Adaptive verwerking kleurenbeelden binnen begrensd deel van de kleurenruimte

    Verbeek, PW., 2003, Patent No. NL 1022258, Priority date 21 Nov 2003

    Research output: Patent

  20. Estimation of curvature based shape properties of surfaces in 3D grey-value images

    Rieger, B., van Vliet, LJ. & Verbeek, PW., 2003, In : Lecture Notes in Computer Science. 2749, p. 262-267 6 p.

    Research output: Contribution to journalArticleScientificpeer-review

  21. Monitoring enzymatic reactions in nanolitre wells

    Young, IT., Moerman, R., van den Doel, LR., Iordanov, VP., Kroon, AR., Dietrich, HRC., van Dedem, GWK., Bossche, A., Gray, BL., Sarro, PM., Verbeek, PW. & van Vliet, LJ., 2003, In : Journal of Microscopy. 212, 3, p. 254-263 10 p.

    Research output: Contribution to journalArticleScientificpeer-review

  22. Monitoring enzymatic reactions with in situ sensors

    Young, IT., Iordanov, VP., Kroon, AR., Dietrich, HRC., Moerman, R., van den Doel, LR., van Dedem, GWK., Bossche, A., Gray, BL., Sarro, PM., Verbeek, PW. & van Vliet, LJ., 2003, In : Proceedings of SPIE- International Society for Optical Engineering. 4966, p. 76-82 7 p.

    Research output: Contribution to journalConference articleScientificpeer-review

  23. Nonlinear image processing using artificial neural networks

    de Ridder, D., Duin, RPW., Egmont-Petersen, M., van Vliet, LJ. & Verbeek, PW., 2003, In : Advances in Imaging and Electron Physics. 126, p. 351-450 100 p.

    Research output: Contribution to journalArticleScientificpeer-review

  24. Robust Curve Detection Using a Radon Transform in Orientation Space

    van Ginkel, M., Kraaijveld, MA., van Vliet, LJ., Reding, EP., Verbeek, PW. & Lammers, HJ., 2003, In : Lecture Notes in Computer Science. 2749, p. 125-132 8 p.

    Research output: Contribution to journalArticleScientificpeer-review

  25. The D-dimensional inverse vector-gradient operator and its application for scale-free image enhancement

    Verbeek, PW. & Dijk, J., 2003, In : Lecture Notes in Computer Science. 2756, p. 738-745 8 p.

    Research output: Contribution to journalArticleScientificpeer-review

  26. The generalised Radon transform: sampling and memory considerations

    Luengo Hendriks, CL., van Ginkel, M., Verbeek, PW. & van Vliet, LJ., 2003, In : Lecture Notes in Computer Science. 2756, p. 681-688 8 p.

    Research output: Contribution to journalArticleScientificpeer-review

  27. 2002
  28. A new sharpness measure based on Gaussian lines and edges

    Dijk, J., van Ginkel, M., van Asselt, RJ., van Vliet, LJ. & Verbeek, PW., 2002, Proceedings ASCI 2002. Deprettere, EF., Belloum, A., Heijnsdijk, JWJ. & van der Stappen, F. (eds.). Delft: ASCI, p. 39-43 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  29. Curvature Estimation of Surfaces in 3D Grey-Value Images

    Rieger, B., Timmermans, FJ., van Vliet, LJ. & Verbeek, PW., 2002, ICPR16, Proceedings. Kasturi, R., Laurendeau, D. & Suen, C. (eds.). Los Alamitos, CA: IEEE, p. 684-687 4 p. (International Conference on Pattern Recognition; vol. 1).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  30. Kwaliteitsmaten voor de perceptie van drukwerk

    Dijk, J., Young, IT. & Verbeek, PW., 2002, s.l.: s.n. 8 p.

    Research output: Book/ReportReportProfessional

  31. The Effect of Gamma and Chroma on the Perception of Color Images

    Dijk, J., Verbeek, PW., Walraven, J. & Young, IT., 2002, CGIV'2002, Proceedings. Fernandez-Maloigne, C. & Schettini, R. (eds.). Springfield, VA, USA: IS&T - Soc. for Imaging Science and Technology, p. 175-180 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  32. The PSD Transfer Function

    de Bakker, M., Verbeek, PW., Steenvoorden, GK. & Young, IT., 2002, In : IEEE Transactions on Electron Devices. 49, 1, p. 202-206 5 p.

    Research output: Contribution to journalArticleScientificpeer-review

  33. 2001
  34. Advanced texture segmentation of 2D and 3D subsurface images

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 2001, s.l.: s.n. 9 p.

    Research output: Book/ReportReportProfessional

  35. Advanced texture segmentation of 2D and 3D subsurface images

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 2001, s.l.: s.n. 6 p.

    Research output: Book/ReportReportProfessional

  36. Analysis and detection of 3D curvilinear structures.

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 2001, Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging.. Lagendijk, RL., Heijnsdijk, JWJ., Pimentel, AD. & Wilkinson, MHF. (eds.). Delft: ASCI, p. 35-40 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  37. Applications of Image Analysis in Orientation Space.

    van Ginkel, M., van Vliet, LJ. & Verbeek, PW., 2001, Fourth Quinquennial Review 1996-2001 Dutch Society for Pattern Recognition and Image Processing.. Vossepoel, AM. & Vos, FM. (eds.). Delft: NVPHBV, p. 355-370 16 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

  38. Borehole Imaging

    van Ginkel, M., Kraaijveld, MA., Reding, E., Verbeek, PW. & van Vliet, LJ., 2001, IPC No. A1, Patent No. PCT/IPN WO 01/84187, Priority date 8 Nov 2001

    Research output: Patent

  39. Confidence and curvature estimation of curvilinear structures in 3-D.

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 2001, ICCV'01 volume II. Los Alamitos, CA.: IEEE, p. 139-144 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  40. Continuous Cube to Cube Mappings as Analytic 3D Look-up Tables for RGB Color Rendering.

    Verbeek, PW., 2001, Fourth Quinquennial Review 1996-2001 Dutch Society for Pattern Recognition and Image Processing.. Vossepoel, AM. & Vos, FM. (eds.). Delft: NVPHBV, p. 431-437 7 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

  41. Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields.

    van de Weijer, J., van Vliet, LJ., Verbeek, PW. & van Ginkel, M., 2001, In : IEEE Transactions on Pattern Analysis and Machine Intelligence. 23, 9, p. 1035-1042 8 p.

    Research output: Contribution to journalArticleScientificpeer-review

  42. Eenduidige optische afbeelding.

    Verbeek, PW., 2001, Priority date 1 Jan 1800

    Research output: Patent

  43. Position sensitive detector.

    de Bakker, M., Verbeek, PW. & Steenvoorden, GK., 2001, Patent No. PCT/IPN WO 0163678, Priority date 30 Aug 2001

    Research output: Patent

  44. Quality measures for printed material-10.

    Dijk, J., Young, IT., Verbeek, PW. & Walraven, JC., 2001, Onbek.: Onbek.

    Research output: Book/ReportReportProfessional

  45. Quality measures for printed material-9.

    Dijk, J., Young, IT., Verbeek, PW. & Walraven, JC., 2001, Onbek.: Onbek.

    Research output: Book/ReportReportProfessional

  46. Robust Curve Detection using a Radon Transform in Orientation Space Applied to Fracture Detection in Borehole Images.

    van Ginkel, M., van Vliet, LJ., Verbeek, PW., Kraaijveld, MA., Reding, E. & Lammers, HJ., 2001, Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging.. Lagendijk, RL., Heijnsdijk, JWJ., Pimentel, AD. & Wilkinson, MHF. (eds.). Delft: ASCI, p. 84-91 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  47. The effect of gamma and chroma on the perception of color images.

    Dijk, J., Verbeek, PW., Walraven, JC. & Young, IT., 2001, Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging.. Lagendijk, RL., Heijnsdijk, JWJ., Pimentel, AD. & Wilkinson, MHF. (eds.). Delft: ASCI, p. 275-282 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  48. 2000
  49. Advanced texture segmentation of 2D and 3D subsurface images.

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 2000, Delft: Delft University of Technology. 7 p.

    Research output: Book/ReportReportProfessional

  50. Advanced texture segmentation of 2D and 3D subsurface images.

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 2000, Delft: Delft University of Technology. 8 p.

    Research output: Book/ReportReportProfessional

  51. Finding and describing 3D landmarks by scale adaptive methods.

    de Vries, G. & Verbeek, PW., 2000, Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging. van Vliet, LJ., Heijnsdijk, JWJ., Kielman, T. & Knijnenburg, PMW. (eds.). Delft: ASCI, p. 302-306 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  52. Quality measures for printed material-7.

    Dijk, J., Young, IT., Verbeek, PW. & Walraven, JC., 2000, Delft: Delft University of Technology. 7 p.

    Research output: Book/ReportReportProfessional

  53. Quality measures for printed material-8.

    Dijk, J., Young, IT., Verbeek, PW. & Walraven, JC., 2000, Delft: Delft University of Technology. 8 p.

    Research output: Book/ReportReportProfessional

  54. Robust Curvature Estimation by Finding Optimal Circular Segments in Orientation Space.

    van Ginkel, M., van Vliet, LJ. & Verbeek, PW., 2000, Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging. van Vliet, LJ., Heijnsdijk, JWJ., Kielman, T. & Knijnenburg, PMW. (eds.). Delft: ASCI, p. 53-58 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  55. Scale-adaptive landmark detection, classification and size estimation in 3D object-background images.

    de Vries, G. & Verbeek, PW., 2000, ICPR15, Proc. 15th Int. Conference on Pattern Recognition. Sanfeliu, A., Villanueva, JJ., Vanrell, M., Alquezar, R., Jain, AK. & Kittler, J. (eds.). Los Alamitos: IEEE, p. 1026-1029 4 p. (International Conference on Pattern Recognition; vol. 3).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  56. Smart PSD-array for sheet of light range imaging.

    de Bakker, M., Verbeek, PW. & Steenvoorden, GK., 2000, Sensors and Cameras Systems for Scientific, Industrial and Digital Photography Applications (Proc. Electronic Imaging 2000). Blouke, MM., Williams, GM., Sampat, N. & Yeh, T. (eds.). p. 21-32 12 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  57. The effect of gamma on the perception of printed color images.

    Dijk, J., Verbeek, PW., Walraven, JC. & Young, IT., 2000, Proc. ASCI 2000, 6th Annual Conf. of the Advanced School for Computing and Imaging. van Vliet, LJ., Heijnsdijk, JWJ., Kielman, T. & Knijnenburg, PMW. (eds.). Delft: ASCI, p. 45-52 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  58. The effect of gamma on the perception of printed color images.

    Dijk, J., Verbeek, PW., Walraven, JC. & Young, IT., 2000, Proc. 1st Int. Conf. Color in Graphics and Image Processing. p. 7-12 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  59. 1999
  60. A new measure for the effect of sharpening and smoothing filters on images

    Dijk, J., de Ridder, D., Verbeek, PW., Walraven, J., Young, IT. & van Vliet, LJ., 1999, SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis. Ersboll, BK. & Johansen, P. (eds.). Lyngby: Pattern Recognition Society of Denmark, p. 213-220 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  61. A quantitative measure for the perception of sharpening and smoothing in images

    Dijk, J., de Ridder, D., Verbeek, PW., Walraven, J., Young, IT. & van Vliet, LJ., 1999, ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging. Kaandorp, JA., Vosselman, MG., Boasson, M. & Tonino, JFM. (eds.). Delft: ASCI, p. 291-298 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  62. A weight set decorrelating algorithm for neural network interpretation and symmetry breaking

    de Ridder, D., Duin, RPW., Verbeek, PW. & van Vliet, LJ., 1999, SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis. Johansen, P. & Ersboll, BK. (eds.). Lyngby: Pattern Recognition Society Denmark, p. 739-746 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  63. Advanced texture segmentation of 2D and 3D subsurface images

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 1999, Delft: Delft University of Technology. 7 p.

    Research output: Book/ReportReportProfessional

  64. Advanced texture segmentation of 2D and 3D subsurface images

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 1999, Delft: Delft University of Technology. 6 p.

    Research output: Book/ReportReportProfessional

  65. Automated Highlighting and Detection of Fractures in Borehole Images

    van Ginkel, M., van Vliet, LJ. & Verbeek, PW., 1999, Delft: Delft University of Technology. 118 p.

    Research output: Book/ReportReportProfessional

  66. Curvature estimation from orientation fields

    van Ginkel, M., van de Weijer, J., van Vliet, LJ. & Verbeek, PW., 1999, SCIA'99, Proc. 11th Scandanavian Conference on Image Analysis. Johansen, P. & Ersboll, BK. (eds.). Lyngby: Pattern Recognition Society of Denmark, p. 545-551 7 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  67. Curvature estimation from orientaton fields

    van Ginkel, M., van de Weijer, J., Verbeek, PW. & van Vliet, LJ., 1999, ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging. Kaandorp, JA., Boasson, M., Tonino, JFM. & Vosselman, MG. (eds.). Deft: ASCI, p. 299-306 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  68. Edge preserving orientation adaptive filtering

    Bakker, P., van Vliet, LJ. & Verbeek, PW., 1999, ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging. Tonino, JFM., Boasson, M., Vosselman, MG. & Kaandorp, JA. (eds.). Delft: ASCI, p. 207-213 7 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  69. Edge preserving orientation adaptive filtering

    Bakker, P., van Vliet, LJ. & Verbeek, PW., 1999, Proc. IEEE-CS Conf. Computer Vision and Pattern Recognition. Los Almalitos: IEEE, p. 535-540 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  70. Edge preserving orientation adaptive fit

    Bakker, P., van Vliet, LJ. & Verbeek, PW., 1999, Abstracts of the 2nd ASCI Imaging workshop. Houkes, Z. (ed.). p. 13-14 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  71. Quality measures for printed material-5

    Dijk, J., Young, IT., Verbeek, PW. & Walraven, J., 1999, Delft: Delft University of Technology. 7 p.

    Research output: Book/ReportReportProfessional

  72. Quality measures for printed material-6

    Dijk, J., Young, IT., Verbeek, PW. & Walraven, J., 1999, Delft: Delft University of Technology. 8 p.

    Research output: Book/ReportReportProfessional

  73. The applicability of neural networks to non-linear image processing.

    de Ridder, D., Duin, RPW., Verbeek, PW. & van Vliet, LJ., 1999, In : Pattern Analysis and Applications. 2, 2, p. 111-128 18 p.

    Research output: Contribution to journalArticleScientificpeer-review

  74. The application of a local dimensionality estimator to the analysis of 3D microscopic network structures

    van Kempen, GMP., van den Brink, N., van Vliet, LJ., van Ginkel, M., Verbeek, PW. & Blonk, H., 1999, SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis. Johansen, P. & Ersboll, BK. (eds.). Lyngby: Pattern Recognition Society of Denmark, p. 447-455 9 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  75. Thickness estimation of layer type objects in CT images

    de Vries, G. & Verbeek, PW., 1999, Abstracts of the 2nd ASCI Imaging workshop. Houkes, Z. (ed.). p. 37-38 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  76. Thickness measurement of CT- imaged objects

    de Vries, G., Verbeek, PW. & Stelwagen, U., 1999, ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging. Kaandorp, JA., Boasson, M., Tonino, JFM. & Vosselman, MG. (eds.). Delft: ASCI, p. 179-183 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  77. 1998
  78. A Smart Range Image Sensor

    de Bakker, M., Verbeek, PW. & Steenvoorden, GK., 1998, Proc. 24th European Solid State Circuits Conference. Huijsing, JH., Roermund, AHM. & Grünbacher, H. (eds.). p. 208-211 4 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  79. A smart 2.5D image sensor containing a PSD array and an on-chip multiplexer

    de Bakker, M., Verbeek, PW. & Steenvoorden, GK., 1998, Proc. Dutch Sensor Conference. van den Berg, A. & Bergveld, P. (eds.). p. 11-16 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  80. Advanced texture segmentation of 2D and 3D subsurface images

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 1998, Delft: Technische Universiteit Delft. 8 p.

    Research output: Book/ReportReportProfessional

  81. Advanced texture segmentation of 2D and 3D subsurface images

    Bakker, P., Verbeek, PW. & van Vliet, LJ., 1998, Delft: Technische Universiteit Delft. 7 p.

    Research output: Book/ReportReportProfessional

  82. Curvature estimation for overlapping curved patterns using orientation space

    van Ginkel, M., Verbeek, PW. & van Vliet, LJ., 1998, Proc. ASCI'98, 4th Annual Conference of the Advanced School for Computing and Imaging. ter Haar Romeny, BM., Epema, DHJ., Tonino, JFM. & Wolters, AA. (eds.). p. 173-178 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  83. Improved curvature and anisotropy estimation for curved line bundles

    Verbeek, PW., van Vliet, LJ. & van de Weijer, J., 1998, ICPR'98, Proc. 14th Int. Conference on Pattern Recognition. Jain, AK., Venkatesh, S. & Lovell, BC. (eds.). p. 528-533 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  84. On the application of neural networks to non-linear image processing tasks

    de Ridder, D., Duin, RPW., Verbeek, PW. & van Vliet, LJ., 1998, ICONIP'98, Proc. Int. Conf. on Neural Information Processing Systems 1998. Usui, S. & Omori, T. (eds.). p. 161-165 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  85. Quantitative Analysis of 3D Images

    Young, IT., van Vliet, LJ., van Ginkel, M. & Verbeek, PW., 1998, Proc. 7th European Congress for Stereology. p. 40-42 3 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  86. Recursive Gaussian Derivative Filters

    van Vliet, LJ., Young, IT. & Verbeek, PW., 1998, ICPR'98, Proc. 14th Int. Conference on Pattern Recognition. Jain, AK., Venkatesh, S. & Lovell, BC. (eds.). p. 509-514 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  87. Theory of confocal fluorescence imaging in the programmable array microscope (PAM)\

    Verveer, PJ., Hanley, QS., Verbeek, PW., van Vliet, LJ. & Jovin, TM., 1998, In : Journal of Microscopy. 189, 3, p. 192-198 7 p.

    Research output: Contribution to journalArticleScientificpeer-review

  88. Three-dimensional image analysis of micro structures in microscopical images: anisotropy, orientation and local dimensionality in 3-D images

    van den Brink, N., van Vliet, LJ., van Kempen, GMP. & Verbeek, PW., 1998, Delft: Technische Universiteit Delft. 39 p.

    Research output: Book/ReportReportProfessional

  89. 1997
  90. Characteristics of a PSD range image sensor fabricated in a standard bipolar process

    de Bakker, M., Boddeke, FR. & Verbeek, PW., 1997, ASCI'97 Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging. Bal, HCHE., Jonker, PP. & Tonino, JFM. (eds.). p. 42-48 7 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  91. Design considerations for a Range Image Sensor containing a PSD-array and an On-chip Multiplexer

    de Bakker, M., Verbeek, PW. & Steenvoorden, GK., 1997, ASCI'97, Proc. International Conference on Recent Advances in 3-D Digital Imaging and Modeling. p. 11-18 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  92. Improved Orientation Selectivity for Orientation Estimation

    van Ginkel, M., Verbeek, PW. & van Vliet, LJ., 1997, SCIA'97, Proc. 10th Scandinavian Conference on Image Analysis. Frydrych, JPM. & Visa, A. (eds.). p. 533-537 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  93. Multi-orientation estimation: Selectivity and localization

    van Ginkel, M., Verbeek, PW. & van Vliet, LJ., 1997, ASCI'97, Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging. Bal, HCHE., Jonker, PP. & Tonino, JFM. (eds.). p. 99-105 7 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  94. Texture Analysis and Segmentation of Subsurface Images II, Report

    van Vliet, LJ., Verbeek, PW. & van Ginkel, M., 1997, Delft: Technische Universiteit Delft. 24 p.

    Research output: Book/ReportReportProfessional

  95. 1996
  96. Fast analytical medial-axis localization in convex polyhedra

    Schlicher, MPP., Bouts, E. & Verbeek, PW., 1996, Proc. 13th Int. Conf. on Pattern Recognition. Los Alamitos: IEEE, p. 55-61 7 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  97. High speed acquisition of range images

    Verbeek, PW., van den Ouden, F., Steenvoorden, GK. & de Bakker, M., 1996, Proc. ASCI'96, 2nd Annual Conf. of the Advanced School for Computing and Imaging. Kerckhoofs, EJH., Sloot, PMA., Tonino, JFM. & Vossepoel, AM. (eds.). Delft: ASCI, p. 202-205 4 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  98. High speed acquisition of range images

    Verbeek, PW., van den Ouden, F., Steenvoorden, GK. & de Bakker, M., 1996, Proc. 13th Int. Conf. on Pattern Recognition. Los Alamitos: IEEE, p. 293-297 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  99. Range camera at 12-bits resolution and video speed.

    de Bakker, M., Verbeek, PW. & Steenvoorden, GK., 1996, Proc. 1996 National Sensor Conference. Wolffenbuttel, RF. (ed.). Delft: Delft University Press, p. 39-43 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

  100. Surface roughness estimation of particles in electron microscope images

    van Vliet, LJ., Ekkers, RJ. & Verbeek, PW., 1996, onbekend: sect Quantitative Imaging (IST/QI). 46 p.

    Research output: Book/ReportReportProfessional

  101. Texture Analysis and segmentation of subsurface images I: scale

    van Vliet, LJ. & Verbeek, PW., 1996, onbekend: sect Quantitative Imaging (IST/QI). 12 p.

    Research output: Book/ReportReportProfessional

  102. 1995
  103. Beeldanalyse voor boorgaten. Quantitative Analysis of Borehole Images

    van Vliet, LJ., Verbeek, PW. & Brusse, H., 1995, onbekend: sect Quantitative Imaging (IST/QI). 48 p.

    Research output: Book/ReportReportProfessional

ID: 161515