1. 2017
  2. Non-intrusive Near-field Characterization of Microwave Circuits and Devices

    Hou, R., 2017, 126 p.

    Research output: ThesisDissertation (TU Delft)Scientific

  3. 2016
  4. Contactless Measurement of Absolute Voltage Waveforms by a Passive Electric-Field Probe

    Hou, R., Spirito, M., Van Rijs, F. & Vreede, L. C. N. D., 9 Nov 2016, In : IEEE Microwave and Wireless Components Letters. 26, 12, p. 1008-1010 3 p.

    Research output: Contribution to journalArticleScientificpeer-review

  5. Nonintrusive Near-Field Characterization of Spatially Distributed Effects in Large-Periphery High-Power GaN HEMTs

    Hou, R., Lorenzini, M., Spirito, M., Roedle, T., Van Rijs, F. & Vreede, L. C. N. D., 1 Nov 2016, In : IEEE Transactions on Microwave Theory and Techniques. 64, 11, p. 4048-4062 15 p.

    Research output: Contribution to journalArticleScientificpeer-review

  6. 2015
  7. Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors

    Hou, R., Spirito, M., Heeres, R., van Rijs, F. & de Vreede, LCN., 2015, Proceedings - 2015 IEEE MTT-S International Microwave Symposium. s.n. (ed.). Piscataway, NJ, USA: IEEE Society, p. 1-3 3 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  8. 2014
  9. A package-integratable six-port reflectometer for power devices

    Venter, RG., Hou, R., Buisman, K., Spirito, M., Werner, K. & de Vreede, LCN., 2014, Proceedings - 2014 IEEE MTT-S International Microwave Symposium. Raman, S., Barker, S. & Bedard et al, D. (eds.). New York, NJ, USA: IEEE Society, p. 1-4 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  10. 2012
  11. Contactless measurement of in-circuit reflection coefficients

    Hou, R., Spirito, M., Kooij, BJ., van Rijs, F. & de Vreede, LCN., 2012, IEEE MTT-S 2012 International Microwave Symposium Digest. Wu, K. (ed.). Piscataway, NJ, USA: IEEE Society, p. 1-3 3 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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