Research output

  1. Localization microscopy at doubled precision with patterned illumination

    Research output: Contribution to journalArticleScientificpeer-review

  2. High precision wavefront control in point spread function engineering for single emitter localization

    Research output: Contribution to journalArticleScientificpeer-review

  3. Impact of optical aberrations on axial position determination by photometry

    Research output: Contribution to journalLetterScientificpeer-review

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ID: 11230884