Research output

  1. A simplified calibration procedure for on-wafer power levelled S-parameter measurements at mm-wave

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  2. Power control for S-parameters and large signal characterization at (sub)-mmWave frequencies

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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ID: 222663