Research output

  1. The Power of Computation-in-Memory Based on Memristive Devices

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  2. Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  3. Fan-out enabled spin wave majority gate

    Research output: Contribution to journalArticleScientificpeer-review

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Activities

  1. IEEE Design & Test (Journal)

    Activity: Publication peer-review and editorial workEditorial activity

  2. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Journal)

    Activity: Publication peer-review and editorial workEditorial activity

  3. Journal of Electronic Testing: theory and applications (Journal)

    Activity: Publication peer-review and editorial workEditorial activity

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ID: 118586