Research output

  1. A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar

    Research output: Scientific - peer-review › Article

  2. Challenges and Solutions in Emerging Memory Testing

    Research output: Scientific - peer-review › Article

  3. Impact and mitigation of SRAM read path aging

    Research output: Scientific - peer-review › Article

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Activities

  1. IEEE Design & Test (Journal)

    Activity: Publication peer-review and editorial work › Editorial activity

  2. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Journal)

    Activity: Publication peer-review and editorial work › Editorial activity

  3. Journal of Electronic Testing: theory and applications (Journal)

    Activity: Publication peer-review and editorial work › Editorial activity

View all (24) »

ID: 118586