Research output

  1. A Computation-In-Memory Accelerator Based on Resistive Devices

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  2. Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

    Research output: Contribution to journalArticleScientificpeer-review

  3. CIM-SIM: Computation in Memory SIMuIator

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

View all (209) »

Activities

  1. IEEE Design & Test (Journal)

    Activity: Publication peer-review and editorial workEditorial activity

  2. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Journal)

    Activity: Publication peer-review and editorial workEditorial activity

  3. Journal of Electronic Testing: theory and applications (Journal)

    Activity: Publication peer-review and editorial workEditorial activity

View all (24) »

ID: 118586