Research output

  1. Challenges and Solutions in Emerging Memory Testing

    Research output: Contribution to journalArticleScientificpeer-review

  2. Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMs

    Research output: Contribution to journalArticleScientificpeer-review

  3. Electrical Modeling of STT-MRAM Defects

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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Activities

  1. IEEE Design & Test (Journal)

    Activity: Publication peer-review and editorial workEditorial activity

  2. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Journal)

    Activity: Publication peer-review and editorial workEditorial activity

  3. Journal of Electronic Testing: theory and applications (Journal)

    Activity: Publication peer-review and editorial workEditorial activity

View all (24) »

ID: 118586