Research output

  1. Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

    Research output: Contribution to journal › Article › Scientific › peer-review

  2. CIM-SIM: Computation in Memory SIMuIator

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

  3. Methodology for Application-Dependent Degradation Analysis of Memory Timing

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

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Activities

  1. IEEE Design & Test (Journal)

    Activity: Publication peer-review and editorial work › Editorial activity

  2. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Journal)

    Activity: Publication peer-review and editorial work › Editorial activity

  3. Journal of Electronic Testing: theory and applications (Journal)

    Activity: Publication peer-review and editorial work › Editorial activity

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ID: 118586