1. 2020
  2. The Power of Computation-in-Memory Based on Memristive Devices

    Yu, J., Abu Lebdeh, M., Du Nguyen, H. A., Taouil, M. & Hamdioui, S., 15 Jan 2020, 25th Asia and South Pacific Design Automation Conference (ASP-DAC). IEEE, p. 385-392 8 p. 9045162

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 2020, Proceedings - 2019 IEEE 28th Asian Test Symposium, ATS 2019. Bilof, R. S. (ed.). Piscataway: IEEE, Vol. 2019-December. p. 129-134 6 p. 8949396. (2019 IEEE 28TH ASIAN TEST SYMPOSIUM (ATS)).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  4. Fan-out enabled spin wave majority gate

    Mahmoud, A., Vanderveken, F., Adelmann, C., Ciubotaru, F., Hamdioui, S. & Cotofana, S., 2020, In : AIP Advances. 10, 3, p. 035119-1 - 035119-6 6 p., 035119.

    Research output: Contribution to journalArticleScientificpeer-review

  5. Skeleton-based Synthesis Flow for Computation-In-Memory Architectures

    Yu, J., Nane, R., Ashraf, I., Taouil, M., Hamdioui, S., Corporaal, H. & Bertels, K., 2020, In : IEEE Transactions on Emerging Topics in Computing. p. 1-13 13 p.

    Research output: Contribution to journalArticleScientificpeer-review

  6. 2019
  7. Defect and Fault Modeling Framework for STT-MRAM Testing

    Wu, L., Rao, S., Taouil, M., Cardoso Medeiros, G., Fieback, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 17 Dec 2019, In : IEEE Transactions on Emerging Topics in Computing. 15 p.

    Research output: Contribution to journalArticleScientificpeer-review

  8. Device-Aware Test: A New Test Approach Towards DPPB Level

    Fieback, M., Wu, L., Cardoso Medeiros, G., Aziza, H., Rao, S., Marinissen, E. J., Taouil, M. & Hamdioui, S., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE, 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  9. Testing Computation-in-Memory Architectures Based on Emerging Memories

    Hamdioui, S., Fieback, M., Nagarajan, S. & Taouil, M., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE, 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  10. Approximate TMR based on successive approximation and loop perforation in microprocessors

    Rodrigues, G. S., Fonseca, J. S., Kastensmidt, F. L., Pouget, V., Bosio, A. & Hamdioui, S., 1 Sep 2019, In : Microelectronics Reliability. 100-101, 7 p., 113385.

    Research output: Contribution to journalArticleScientificpeer-review

  11. Efficient Methodology for ISO26262 Functional Safety Verification

    Silva, F. A. D., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 1 Jul 2019, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Gizopoulos, D., Alexandrescu, D., Papavramidou, P. & Maniatakos, M. (eds.). Piscataway: IEEE, p. 255-256 2 p. 8854449

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  12. Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

    Kraak, D., Taouil, M., Agbo, I., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 1 Jun 2019, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27, 6, p. 1308-1321 14 p., 8678671.

    Research output: Contribution to journalArticleScientificpeer-review

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