1. 2012
  2. In-situ TEM on (de)hydrogenation of Pd at 0.5¿4.5 bar hydrogen pressure and 20¿400°C

    Yokosawa, T., Alan, T., Pandraud, G., Dam, B. & Zandbergen, HW., 2012, In : Ultramicroscopy. 112, 1, p. 47-52 6 p.

    Research output: Contribution to journalArticleScientificpeer-review

  3. Micro-fabricated channel with ultra-thin yet ultra-strong windows enables electron microscopy under 4-bar pressure

    Alan, T., Yokosawa, T., Gaspar, J., Pandraud, G., Paul, O., Creemer, JF., Sarro, PM. & Zandbergen, HW., 2012, In : Applied Physics Letters. 100, 8, p. 1-4 4 p.

    Research output: Contribution to journalArticleScientificpeer-review

  4. 2011
  5. An all-in-one nanoreactor for high-resolution microscopy on nanomaterials at high pressures

    Creemer, JF., Santagata, F., Morana, B., Mele, L., Alan, T., Iervolino, E., Pandraud, G. & Sarro, PM., 2011, 24th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2011). Böhringer, K. & Lin, L. (eds.). Piscataway, NJ, USA: IEEE Society, p. 1103-1106 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  6. Fabrication of AlN slender piezoelectric cantilevers for high-speed MEMS actuations

    Tran, AT., Pandraud, G., Schellevis, H., Alan, T., Aravindh, V., Wunnicke, O. & Sarro, PM., 2011, Proceedings Eurosensors XXV, September 4-7, 2011, Athens, Greece. Tsamis, C. & Kaltas, G. (eds.). Athens, Greece: Elsevier, p. 673-676 4 p. (Procedia Engineering; vol. 25).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  7. 2009
  8. Characterization of ultrathin membranes to enable TEM observation of gas reaction at high pressures

    Alan, T., Gaspar, J., Paul, O., Zandbergen, HW., Creemer, JF. & Sarro, PM., 2009, Proceedings of the ASME 2009 International Mechanical Engineering Congress & Exposition. Mikata, Y. (ed.). Lake Buena Vista, Florida, USA: ASME, p. 1-5 5 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  9. 2007
  10. A comparative study of the strength of Si, SiN and SiC used at nanoscales

    Alan, T. & Sarro, PM., 2007, SAFE 2007 Semiconductor advances for future electornics. s.n. (ed.). Veldhoven, The Netherlands: STW, p. 395-398 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  11. A comparative study of the strength of Si, SiN and SiC used at nanoscales - Materials and devices

    Alan, T. & Sarro, PM., 2007, Material research society symposium proceeding. LaVan, DA., da Silva, MG., Spearing, SM. & Vengallatore, S. (eds.). Warrendale: Materials Research Society, p. 1-5 5 p. (Materials Research Society Symposium Proceedings; vol. 1052).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  12. Improving fracture properties of Si nanobeams with methyl monolayers

    Alan, T., Sengupta, D., Hines, M. & Zehnder, AT., 2007, The 20th European Conference on Solid-State Transducers (Eurosensors XX). s.n. (ed.). Göteborg, Sweden: s.l., p. 1-3 3 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  13. Oxide to oxide wafer bonding for three dimensional (3D) IC integration technologies

    Cannavo, M., van Zeijl, HW., Pandraud, G., Driel, JV., Alan, T. & Sarro, PM., 2007, SAFE 2007 Semiconductor advances for future electornics. s.n. (ed.). Veldhoven, The Netherlands: STW, p. 509-512 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

  14. 2006
  15. Effect of surface morphology on the fracture strength of silicon nanobeams

    Alan, T., Hines, MA. & Zehnder, AT., 2006, In : Applied Physics Letters. 89, 9, p. 091901-1-091901-3

    Research output: Contribution to journalArticleScientificpeer-review

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