1. 2019
  2. Temperature sensors incorporated into a CMOS image sensor with column zoom ADCs

    Xie, S., Ge, X. & Theuwissen, A., 2019, 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings. Institute of Electrical and Electronics Engineers (IEEE), Vol. 2019-May. p. 1-5 5 p. 8702321

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. 2018
  4. Temporal noise analysis of charge-domain sampling readout circuits for cmos image sensors

    Ge, X. & Theuwissen, A. J. P., 2018, In : Sensors. 18, 3, p. 1-16 16 p., 707.

    Research output: Contribution to journalArticleScientificpeer-review

  5. 2017
  6. A 0.5erms Temporal Noise CMOS Image Sensor With Gm-Cell-Based Pixel and Period-Controlled Variable Conversion Gain

    Ge, X. & Theuwissen, A. J. P., 2017, In : IEEE Transactions on Electron Devices. 64, 12, p. 5019-5026 8 p.

    Research output: Contribution to journalArticleScientificpeer-review

  7. Analysis and calibration of process variations for an array of temperature sensors

    Xie, S., Abarca, A., Markenhof, J., Ge, X. & Theuwissen, A., 2017, Proceedings of IEEE Sensors Conference 2017. Piscataway, NJ: IEEE, p. 1-3 3 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  8. 2016
  9. A Potential-Based Characterization of the Transfer Gate in CMOS Image Sensors

    Xu, Y., Ge, X. & Theuwissen, AJP., 28 Jul 2016, In : IEEE Transactions on Electron Devices. 63, 1, p. 42-48 7 p.

    Research output: Contribution to journalArticleScientificpeer-review

  10. A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique

    Ge, X., Mamdy, B. & Theuwissen, A. J. P., 14 Feb 2016, Electronic Imaging: Image Sensors and Imaging Systems 2016. SPIE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  11. A CMOS image sensor with nearly unity-gain source follower and optimized column amplifier

    Ge, X. & Theuwissen, A. J. P., 2016, 2016 IEEE Sensors Proceedings. Fontana, E. & Ruiz-Zamarreno, C. (eds.). Piscataway, NJ: IEEE, p. 1-3 3 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  12. 2015
  13. Investigating transfer gate potential barrier by feed-forward effect measurement

    Xu, Y., Ge, X. & Theuwissen, AJP., 2015, Proceedings of the International Image Sensor Workshop. Magnan, P. (ed.). s.l.: International Image Sensor Society, p. 116-120 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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