1. 2020
  2. Java Unit Testing Tool Competition - Eighth Round

    Devroey, X., Panichella, S. & Gambi, A., May 2020, IEEE/ACM 42nd International Conference on Software Engineering Workshops (ICSE 2020). ACM DL, 4 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  3. Search-based crash reproduction using behavioural model seeding

    Derakhshanfar, P., Devroey, X., Perrouin, G., Zaidman, A. & van Deursen, A., 12 Apr 2020, In : Software Testing, Verification and Reliability. 30, 3, 28 p., e1733.

    Research output: Contribution to journalArticleScientificpeer-review

  4. MALTESQUE 2019 Workshop Summary

    Arcelli Fontana, F., Perrouin, G., Ampatzoglou, A., Archer, M., Walter, B., Cordy, M., Palomba, F. & Devroey, X., 1 Jan 2020, In : Software Engineering Notes. 45, 1, p. 34–35

    Research output: Contribution to journalArticleScientific

  5. Report from the 1st Int. Workshop on Education through Advanced Software Engineering and Artificial Intelligence (EASEAI ’19)

    Vanderose, B., Frenay, B., Henry, J. & Devroey, X., 1 Jan 2020, In : Software Engineering Notes. 45, 1, p. 25–27

    Research output: Contribution to journalArticleScientific

  6. A benchmark-based evaluation of search-based crash reproduction

    Soltani, M., Derakhshanfar, P., Devroey, X. & van Deursen, A., Jan 2020, In : Empirical Software Engineering. 25, 1, p. 96–138 43 p.

    Research output: Contribution to journalArticleScientificpeer-review

  7. Crash Reproduction Using Helper Objectives

    Derakhshanfar, P., Devroey, X., Zaidman, A., van Deursen, A. & Panichella, A., 2020, Genetic and Evolutionary Computation Conference Companion (GECCO ’20 Companion). Cancún, Mexico: ACM DL, 3 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  8. 2019
  9. A Decade of Featured Transition Systems

    Cordy, M., Devroey, X., Legay, A., Perrouin, G., Classen, A., Heymans, P., Schobbens, P-Y. & Raskin, J-F., 9 Nov 2019, From Software Engineering to Formal Methods and Tools, and Back.. ter Beek, M. H., Fantechi, A. & Semini, L. (eds.). Cham: Springer, Vol. 11865. p. 285-312 28 p. (Lecture Notes in Computer Science; vol. 11865).

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientificpeer-review

  10. Welcome from the chairs

    Fontana, F. A., Perrouin, G., Ampatzoglou, A., Acher, M., Walter, B., Cordy, M., Palomba, F. & Devroey, X., 27 Aug 2019, MaLTeSQuE 2019 - Proceedings of the 3rd ACM SIGSOFT International Workshop on Machine Learning Techniques for Software Quality Evaluation, co-located with ESEC/FSE 2019. Fontana, F. A., Walter, B., Ampatzoglou, A., Palomba, F., Perrouin, G., Acher, M., Cordy, M. & Devroey, M. (eds.). p. III-IV (MaLTeSQuE 2019 - Proceedings of the 3rd ACM SIGSOFT International Workshop on Machine Learning Techniques for Software Quality Evaluation, co-located with ESEC/FSE 2019).

    Research output: Chapter in Book/Conference proceedings/Edited volumeForeword/postscriptScientific

  11. Welcome from the chairs

    Vanderose, B., Frenay, B., Henry, J. & Devroey, X., 26 Aug 2019, EASEAI 2019 - Proceedings of the 1st ACM SIGSOFT International Workshop on Education through Advanced Software Engineering and Artificial Intelligence, co-located with ESEC/FSE 2019. Vanderose, B., Frenay, B., Henry, B. & Henry, X. (eds.). p. III (EASEAI 2019 - Proceedings of the 1st ACM SIGSOFT International Workshop on Education through Advanced Software Engineering and Artificial Intelligence, co-located with ESEC/FSE 2019).

    Research output: Chapter in Book/Conference proceedings/Edited volumeForeword/postscriptScientific

  12. Towards Automated Test Case Generation Maturity

    Molina, U. R., Kifetew, F. M. & Devroey, X., 27 May 2019, 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing (SBST). IEEE, p. 9-10 2 p. 8812190

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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