A. van Deursen (Recipient)

Received for: Predicting class testability using object-oriented metrics. Bruntink, M. & van Deursen, A. 2004 SCAM 2004; Proceedings of the Fourth IEEE international worksho on source code analysis an manipulation. Los Alamitos, CA. USA: IEEE Computer Society, p. 136-145 10 p.
Awarded dateOct 2004
Degree of recognitionInternational

ID: 35745605