Standard

1/f noise and microsructure in thin aluminium lines. / Ochs, E; van de Homberg, MJC; Alkemade, PFA; Armbruster, K; Seeger, A; Stoll, H; Verbruggen, AH.

Proceedings of the 14th International Conference on Noise in Physical Systems and 1/f Fluctuations. ed. / C Claeys; E Simoen. 1997. p. 415-418.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Harvard

Ochs, E, van de Homberg, MJC, Alkemade, PFA, Armbruster, K, Seeger, A, Stoll, H & Verbruggen, AH 1997, 1/f noise and microsructure in thin aluminium lines. in C Claeys & E Simoen (eds), Proceedings of the 14th International Conference on Noise in Physical Systems and 1/f Fluctuations. pp. 415-418.

APA

Ochs, E., van de Homberg, MJC., Alkemade, PFA., Armbruster, K., Seeger, A., Stoll, H., & Verbruggen, AH. (1997). 1/f noise and microsructure in thin aluminium lines. In C. Claeys, & E. Simoen (Eds.), Proceedings of the 14th International Conference on Noise in Physical Systems and 1/f Fluctuations (pp. 415-418)

Vancouver

Ochs E, van de Homberg MJC, Alkemade PFA, Armbruster K, Seeger A, Stoll H et al. 1/f noise and microsructure in thin aluminium lines. In Claeys C, Simoen E, editors, Proceedings of the 14th International Conference on Noise in Physical Systems and 1/f Fluctuations. 1997. p. 415-418

Author

Ochs, E ; van de Homberg, MJC ; Alkemade, PFA ; Armbruster, K ; Seeger, A ; Stoll, H ; Verbruggen, AH. / 1/f noise and microsructure in thin aluminium lines. Proceedings of the 14th International Conference on Noise in Physical Systems and 1/f Fluctuations. editor / C Claeys ; E Simoen. 1997. pp. 415-418

BibTeX

@inproceedings{c844d95075524e50908a558e40b60df8,
title = "1/f noise and microsructure in thin aluminium lines",
author = "E Ochs and {van de Homberg}, MJC and PFA Alkemade and K Armbruster and A Seeger and H Stoll and AH Verbruggen",
year = "1997",
language = "Undefined/Unknown",
pages = "415--418",
editor = "C Claeys and E Simoen",
booktitle = "Proceedings of the 14th International Conference on Noise in Physical Systems and 1/f Fluctuations",

}

RIS

TY - GEN

T1 - 1/f noise and microsructure in thin aluminium lines

AU - Ochs, E

AU - van de Homberg, MJC

AU - Alkemade, PFA

AU - Armbruster, K

AU - Seeger, A

AU - Stoll, H

AU - Verbruggen, AH

PY - 1997

Y1 - 1997

M3 - Conference contribution

SP - 415

EP - 418

BT - Proceedings of the 14th International Conference on Noise in Physical Systems and 1/f Fluctuations

A2 - Claeys, C

A2 - Simoen, E

ER -

ID: 2004969