3D microstructural and texture characterization by means of focused ion beam microscope and integrated EBSD system.

RH Petrov; O León García; LAI Kestens

3D microstructural and texture characterization by means of focused ion beam microscope and integrated EBSD system.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 25th Jubilee International Scientific Conference MTF 2007
Editors	B Tabakova, P Dobrzev, I Yankova, R Dimitrova, B Saikova
Place of Publication	Sofia, Bulgaria
Publisher	Publishing House Technical University
Pages	34-39
Number of pages	6
ISBN (Print)	978-954-438-623-8
Publication status	Published - 2007
Event	25th Jubilee International Scientific Conference MTF 2007 - Sofia, Bulgaria Duration: 14 Sept 2007 → 16 Sept 2007

Publication series

Name
Publisher	Publishing House Technical University

Conference

Conference	25th Jubilee International Scientific Conference MTF 2007
Period	14/09/07 → 16/09/07

Keywords

Conf.proc. > 3 pag

Cite this

Petrov, RH., León García, O., & Kestens, LAI. (2007). 3D microstructural and texture characterization by means of focused ion beam microscope and integrated EBSD system. In B. Tabakova, P. Dobrzev, I. Yankova, R. Dimitrova, & B. Saikova (Eds.), Proceedings of the 25th Jubilee International Scientific Conference MTF 2007 (pp. 34-39). Publishing House Technical University.

Petrov, RH ; León García, O ; Kestens, LAI. / 3D microstructural and texture characterization by means of focused ion beam microscope and integrated EBSD system. Proceedings of the 25th Jubilee International Scientific Conference MTF 2007. editor / B Tabakova ; P Dobrzev ; I Yankova ; R Dimitrova ; B Saikova. Sofia, Bulgaria : Publishing House Technical University, 2007. pp. 34-39

@inproceedings{3a8790d6f7314cce935a570cc2e43bfd,

title = "3D microstructural and texture characterization by means of focused ion beam microscope and integrated EBSD system.",

keywords = "Conf.proc. > 3 pag",

author = "RH Petrov and {Le{\'o}n Garc{\'i}a}, O and LAI Kestens",

year = "2007",

language = "Undefined/Unknown",

isbn = "978-954-438-623-8",

publisher = "Publishing House Technical University",

pages = "34--39",

editor = "B Tabakova and P Dobrzev and I Yankova and R Dimitrova and B Saikova",

booktitle = "Proceedings of the 25th Jubilee International Scientific Conference MTF 2007",

note = "25th Jubilee International Scientific Conference MTF 2007 ; Conference date: 14-09-2007 Through 16-09-2007",

}

Petrov, RH, León García, O & Kestens, LAI 2007, 3D microstructural and texture characterization by means of focused ion beam microscope and integrated EBSD system. in B Tabakova, P Dobrzev, I Yankova, R Dimitrova & B Saikova (eds), Proceedings of the 25th Jubilee International Scientific Conference MTF 2007. Publishing House Technical University, Sofia, Bulgaria, pp. 34-39, 25th Jubilee International Scientific Conference MTF 2007, 14/09/07.

3D microstructural and texture characterization by means of focused ion beam microscope and integrated EBSD system. / Petrov, RH; León García, O; Kestens, LAI.
Proceedings of the 25th Jubilee International Scientific Conference MTF 2007. ed. / B Tabakova; P Dobrzev; I Yankova; R Dimitrova; B Saikova. Sofia, Bulgaria: Publishing House Technical University, 2007. p. 34-39.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - 3D microstructural and texture characterization by means of focused ion beam microscope and integrated EBSD system.

AU - Petrov, RH

AU - León García, O

AU - Kestens, LAI

PY - 2007

Y1 - 2007

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-954-438-623-8

SP - 34

EP - 39

BT - Proceedings of the 25th Jubilee International Scientific Conference MTF 2007

A2 - Tabakova, B

A2 - Dobrzev, P

A2 - Yankova, I

A2 - Dimitrova, R

A2 - Saikova, B

PB - Publishing House Technical University

CY - Sofia, Bulgaria

T2 - 25th Jubilee International Scientific Conference MTF 2007

Y2 - 14 September 2007 through 16 September 2007

ER -

Petrov RH, León García O, Kestens LAI. 3D microstructural and texture characterization by means of focused ion beam microscope and integrated EBSD system. In Tabakova B, Dobrzev P, Yankova I, Dimitrova R, Saikova B, editors, Proceedings of the 25th Jubilee International Scientific Conference MTF 2007. Sofia, Bulgaria: Publishing House Technical University. 2007. p. 34-39