@inproceedings{5c04e3269e39460bb94cd68aff8630c9,
title = "3D-COSTAR: a cost model for 3D stacked ICs",
author = "M Taouil and S Hamdioui and EJ Marinissen and S Bhawmik",
note = "neo; 3D-Test 2012, Anaheim, CA, USA ; Conference date: 08-11-2012 Through 09-11-2012",
year = "2012",
language = "English",
publisher = "IEEE ",
pages = "1--6",
editor = "Y Zorian and E Marijnissen and S Hamdioui",
booktitle = "Proceedings Third IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits",
address = "United States",
}