A 0.7 e- rms temporal-readout-noise CMOS image sensor for low-light-level imaging

Y Chen; Y Xu; Y Chae; A Mierop; X Wang; AJP Theuwissen

doi:10.1109/ISSCC.2012.6177059

A 0.7 e- rms temporal-readout-noise CMOS image sensor for low-light-level imaging

Y Chen, Y Xu, Y Chae, A Mierop, X Wang, AJP Theuwissen

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

69 Citations (Scopus)

Original language	English
Title of host publication	Digest of Technical Papers - 2012 IEEE International Solid-State Circuits Conference.
Editors	H Hidaka, B Nauta et al
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	384-386
Number of pages	3
ISBN (Print)	978-1-4673-0376-7
DOIs	https://doi.org/10.1109/ISSCC.2012.6177059
Publication status	Published - 2012
Event	59th ISSCC, San Francisco, CA, USA - Piscataway, NJ, USA Duration: 19 Feb 2012 → 23 Feb 2012

Publication series

Name
Publisher	IEEE

Conference

Conference	59th ISSCC, San Francisco, CA, USA
Period	19/02/12 → 23/02/12

Access to Document

10.1109/ISSCC.2012.6177059

Cite this

@inproceedings{a5045e12faa24b8389c836cc0f4cfa45,

title = "A 0.7 e- rms temporal-readout-noise CMOS image sensor for low-light-level imaging",

author = "Y Chen and Y Xu and Y Chae and A Mierop and X Wang and AJP Theuwissen",

year = "2012",

doi = "10.1109/ISSCC.2012.6177059",

language = "English",

isbn = "978-1-4673-0376-7",

publisher = "IEEE Society",

pages = "384--386",

editor = "H Hidaka and {Nauta et al}, B",

booktitle = "Digest of Technical Papers - 2012 IEEE International Solid-State Circuits Conference.",

note = "59th ISSCC, San Francisco, CA, USA ; Conference date: 19-02-2012 Through 23-02-2012",

}

Chen, Y, Xu, Y, Chae, Y, Mierop, A, Wang, X & Theuwissen, AJP 2012, A 0.7 e- rms temporal-readout-noise CMOS image sensor for low-light-level imaging. in H Hidaka & B Nauta et al (eds), Digest of Technical Papers - 2012 IEEE International Solid-State Circuits Conference.. IEEE Society, Piscataway, NJ, USA, pp. 384-386, 59th ISSCC, San Francisco, CA, USA, 19/02/12. https://doi.org/10.1109/ISSCC.2012.6177059

A 0.7 e- rms temporal-readout-noise CMOS image sensor for low-light-level imaging. / Chen, Y; Xu, Y; Chae, Y et al.
Digest of Technical Papers - 2012 IEEE International Solid-State Circuits Conference.. ed. / H Hidaka; B Nauta et al. Piscataway, NJ, USA: IEEE Society, 2012. p. 384-386.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A 0.7 e- rms temporal-readout-noise CMOS image sensor for low-light-level imaging

AU - Chen, Y

AU - Xu, Y

AU - Chae, Y

AU - Mierop, A

AU - Wang, X

AU - Theuwissen, AJP

PY - 2012

Y1 - 2012

U2 - 10.1109/ISSCC.2012.6177059

DO - 10.1109/ISSCC.2012.6177059

M3 - Conference contribution

SN - 978-1-4673-0376-7

SP - 384

EP - 386

BT - Digest of Technical Papers - 2012 IEEE International Solid-State Circuits Conference.

A2 - Hidaka, H

A2 - Nauta et al, B

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - 59th ISSCC, San Francisco, CA, USA

Y2 - 19 February 2012 through 23 February 2012

ER -