DOI

Original languageEnglish
Title of host publicationVLSI Design, Automation and Test 2011
EditorsT-T Hwang, T Cheng
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages95-98
Number of pages4
ISBN (Print)978-1-4244-8499-7
DOIs
StatePublished - 2011
EventInternational Symposium on Design, Automation and Test (VLSI-DAT) 2011 -

Publication series

Name
PublisherIEEE

Conference

ConferenceInternational Symposium on Design, Automation and Test (VLSI-DAT) 2011
Period25/04/1128/04/11

    Research areas

  • Conf.proc. > 3 pag

ID: 3109701