A 66-dB SNDR Pipelined Split-ADC in 40-nm CMOS Using a Class-AB Residue Amplifier

Shakil Akter, Rohan Sehgal, Frank van der Goes, Kofi A.A. Makinwa, Klaas Bult

Research output: Contribution to journalArticleScientificpeer-review

16 Citations (Scopus)
312 Downloads (Pure)

Abstract

This paper presents a closed-loop class-AB residue amplifier for pipelined analog-to-digital converters (ADCs). It consists of a push-pull structure with a ``split-capacitor'' biasing circuit that enhances its power efficiency. The amplifier is inherently quite linear, and so incomplete settling can be used to save power while still maintaining sufficient linearity. This also allows the amplifier's gain to be corrected by adjusting its bias current. When combined with digital gain-error detection, in this case the split-ADC technique, the result is a power-efficient gain calibration scheme. In a prototype pipelined ADC, this scheme converges in only 12,000 clock cycles. With a near-Nyquist input, the ADC achieves 66-dB SNDR and 77.3-dB SFDR at 53 MS/s. Implemented in 40-nm CMOS, it dissipates 9 mW, of which 0.83 mW is consumed in the residue amplifiers. This represents a 1.8x improvement in power efficiency compared to state-of-the-art class-AB residue amplifiers.

Original languageEnglish
Pages (from-to)2939-2950
Number of pages12
JournalIEEE Journal of Solid-State Circuits
Volume53
Issue number10
DOIs
Publication statusPublished - 2018

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • Analog gain correction
  • analog-to-digital conversion
  • Calibration
  • Capacitance
  • Capacitors
  • class-AB residue amplifier
  • Clocks
  • differential sampling
  • incomplete settling
  • Linearity
  • Power dissipation
  • split-ADC calibration
  • split-capacitor bias control technique.
  • Transistors

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