This article presents a BJT-based temperature-to-digital-converter (TDC) that achieves ±0.25 °C 3 sigma -inaccuracy from -40 °C to +180 °C after a heater-assisted voltage calibration (HA-VCAL). Its switched-capacitor (SC) ADC employs two sampling capacitors and, thus, the minimum number of critical sampling switches, which minimizes the effects of switch leakage at high temperatures and improves accuracy. The TDC is also equipped with an on-chip heater, with which the sensing BJTs can be rapidly (<0.5 s) heated to about 110 °C. This, in turn, enables VCAL at two different temperatures without the need for a temperature-controlled environment. Realized in a 0.16- mu text {m} standard CMOS, the TDC, including the on-chip heater, occupies 0.15 mm2 and operates from 1.8 V.

Original languageEnglish
Article number8920095
Pages (from-to)369-377
Number of pages9
JournalIEEE Journal of Solid-State Circuits
Volume55
Issue number2
DOIs
Publication statusPublished - 1 Feb 2020

    Research areas

  • BJT, calibration, heater-assisted, low leakage, on-chip heater, temperature sensor, voltage calibration (VCAL), Heating systems, Temperature distribution, Calibration, Stress, Temperature sensors, System-on-chip

ID: 71013563