A BJT-Based Temperature-to-Digital Converter With a 0.25 C 3 $\sigma$ -Inaccuracy From-40 C to 180 C Using Heater-Assisted Voltage Calibration

Bahman Yousefzadeh; Kofi A.A. Makinwa

doi:10.1109/JSSC.2019.2953834

A BJT-Based Temperature-to-Digital Converter With a 0.25 C 3 $\sigma$ -Inaccuracy From-40 C to 180 C Using Heater-Assisted Voltage Calibration

Bahman Yousefzadeh^*, Kofi A.A. Makinwa

^*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

27 Citations (Scopus)

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Abstract

This article presents a BJT-based temperature-to-digital-converter (TDC) that achieves ±0.25 °C 3 sigma -inaccuracy from -40 °C to +180 °C after a heater-assisted voltage calibration (HA-VCAL). Its switched-capacitor (SC) ADC employs two sampling capacitors and, thus, the minimum number of critical sampling switches, which minimizes the effects of switch leakage at high temperatures and improves accuracy. The TDC is also equipped with an on-chip heater, with which the sensing BJTs can be rapidly (<0.5 s) heated to about 110 °C. This, in turn, enables VCAL at two different temperatures without the need for a temperature-controlled environment. Realized in a 0.16- mu text {m} standard CMOS, the TDC, including the on-chip heater, occupies 0.15 mm² and operates from 1.8 V.

Original language	English
Article number	8920095
Pages (from-to)	369-377
Number of pages	9
Journal	IEEE Journal of Solid-State Circuits
Volume	55
Issue number	2
DOIs	https://doi.org/10.1109/JSSC.2019.2953834
Publication status	Published - 2020

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

BJT
calibration
heater-assisted
low leakage
on-chip heater
temperature sensor
voltage calibration (VCAL)
Heating systems
Temperature distribution
Calibration
Stress
Temperature sensors
System-on-chip

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@article{f614cdbe979e449cb0ecb676eeca1643,

title = "A BJT-Based Temperature-to-Digital Converter With a 0.25 C 3 $\sigma$ -Inaccuracy From-40 C to 180 C Using Heater-Assisted Voltage Calibration",

abstract = "This article presents a BJT-based temperature-to-digital-converter (TDC) that achieves ±0.25 °C 3 sigma -inaccuracy from -40 °C to +180 °C after a heater-assisted voltage calibration (HA-VCAL). Its switched-capacitor (SC) ADC employs two sampling capacitors and, thus, the minimum number of critical sampling switches, which minimizes the effects of switch leakage at high temperatures and improves accuracy. The TDC is also equipped with an on-chip heater, with which the sensing BJTs can be rapidly (<0.5 s) heated to about 110 °C. This, in turn, enables VCAL at two different temperatures without the need for a temperature-controlled environment. Realized in a 0.16- mu text {m} standard CMOS, the TDC, including the on-chip heater, occupies 0.15 mm2 and operates from 1.8 V.",

keywords = "BJT, calibration, heater-assisted, low leakage, on-chip heater, temperature sensor, voltage calibration (VCAL), Heating systems, Temperature distribution, Calibration, Stress, Temperature sensors, System-on-chip",

author = "Bahman Yousefzadeh and Makinwa, {Kofi A.A.}",

note = "Green Open Access added to TU Delft Institutional Repository {\textquoteleft}You share, we take care!{\textquoteright} – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. ",

year = "2020",

doi = "10.1109/JSSC.2019.2953834",

language = "English",

volume = "55",

pages = "369--377",

journal = "IEEE Journal of Solid-State Circuits",

issn = "0018-9200",

publisher = "IEEE",

number = "2",

}

TY - JOUR

T1 - A BJT-Based Temperature-to-Digital Converter With a 0.25 C 3 $\sigma$ -Inaccuracy From-40 C to 180 C Using Heater-Assisted Voltage Calibration

AU - Yousefzadeh, Bahman

AU - Makinwa, Kofi A.A.

N1 - Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

PY - 2020

Y1 - 2020

N2 - This article presents a BJT-based temperature-to-digital-converter (TDC) that achieves ±0.25 °C 3 sigma -inaccuracy from -40 °C to +180 °C after a heater-assisted voltage calibration (HA-VCAL). Its switched-capacitor (SC) ADC employs two sampling capacitors and, thus, the minimum number of critical sampling switches, which minimizes the effects of switch leakage at high temperatures and improves accuracy. The TDC is also equipped with an on-chip heater, with which the sensing BJTs can be rapidly (<0.5 s) heated to about 110 °C. This, in turn, enables VCAL at two different temperatures without the need for a temperature-controlled environment. Realized in a 0.16- mu text {m} standard CMOS, the TDC, including the on-chip heater, occupies 0.15 mm2 and operates from 1.8 V.

AB - This article presents a BJT-based temperature-to-digital-converter (TDC) that achieves ±0.25 °C 3 sigma -inaccuracy from -40 °C to +180 °C after a heater-assisted voltage calibration (HA-VCAL). Its switched-capacitor (SC) ADC employs two sampling capacitors and, thus, the minimum number of critical sampling switches, which minimizes the effects of switch leakage at high temperatures and improves accuracy. The TDC is also equipped with an on-chip heater, with which the sensing BJTs can be rapidly (<0.5 s) heated to about 110 °C. This, in turn, enables VCAL at two different temperatures without the need for a temperature-controlled environment. Realized in a 0.16- mu text {m} standard CMOS, the TDC, including the on-chip heater, occupies 0.15 mm2 and operates from 1.8 V.

KW - BJT

KW - calibration

KW - heater-assisted

KW - low leakage

KW - on-chip heater

KW - temperature sensor

KW - voltage calibration (VCAL)

KW - Heating systems

KW - Temperature distribution

KW - Calibration

KW - Stress

KW - Temperature sensors

KW - System-on-chip

UR - http://www.scopus.com/inward/record.url?scp=85079694656&partnerID=8YFLogxK

U2 - 10.1109/JSSC.2019.2953834

DO - 10.1109/JSSC.2019.2953834

M3 - Article

AN - SCOPUS:85079694656

SN - 0018-9200

VL - 55

SP - 369

EP - 377

JO - IEEE Journal of Solid-State Circuits

JF - IEEE Journal of Solid-State Circuits

IS - 2

M1 - 8920095

ER -

A BJT-Based Temperature-to-Digital Converter With a 0.25 C 3 $\sigma$ -Inaccuracy From-40 C to 180 C Using Heater-Assisted Voltage Calibration

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