A Diagnostic Reasoning Approach to Defect Prediction

RF Lima Maranhao De Abreu; A Gonzalez Sanchez; AJC van Gemund

doi:10.1007/978-3-642-21827-9_43

A Diagnostic Reasoning Approach to Defect Prediction

RF Lima Maranhao De Abreu, A Gonzalez Sanchez, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Title of host publication	24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2011)
Editors	KC Mehrotra, et al.
Place of Publication	Berlin, Germany
Publisher	Springer
Pages	416-425
Number of pages	10
ISBN (Print)	978-3-642-21821-7
DOIs	https://doi.org/10.1007/978-3-642-21827-9_43
Publication status	Published - 2011
Event	IEA/AIE 2011 - Berlin, Germany Duration: 28 Jun 2011 → 1 Jul 2011

Publication series

Name
Publisher	Springer

Name	Lecture Notes in Artificial Intelligence
Volume	6704
ISSN (Print)	0302-9743

Conference

Conference	IEA/AIE 2011
Period	28/06/11 → 1/07/11

Keywords

CWTS JFIS < 0.75

Access to Document

10.1007/978-3-642-21827-9_43

Cite this

Lima Maranhao De Abreu, RF., Gonzalez Sanchez, A., & van Gemund, AJC. (2011). A Diagnostic Reasoning Approach to Defect Prediction. In KC. Mehrotra, & et al. (Eds.), 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2011) (pp. 416-425). (Lecture Notes in Artificial Intelligence; Vol. 6704). Springer. https://doi.org/10.1007/978-3-642-21827-9_43

@inproceedings{479f4c4083d24ae5a645f56b3baace3a,

title = "A Diagnostic Reasoning Approach to Defect Prediction",

keywords = "CWTS JFIS < 0.75",

author = "{Lima Maranhao De Abreu}, RF and {Gonzalez Sanchez}, A and {van Gemund}, AJC",

year = "2011",

doi = "10.1007/978-3-642-21827-9_43",

language = "English",

isbn = "978-3-642-21821-7",

publisher = "Springer",

pages = "416--425",

editor = "KC Mehrotra and {et al.}",

booktitle = "24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2011)",

note = "IEA/AIE 2011 ; Conference date: 28-06-2011 Through 01-07-2011",

}

Lima Maranhao De Abreu, RF, Gonzalez Sanchez, A & van Gemund, AJC 2011, A Diagnostic Reasoning Approach to Defect Prediction. in KC Mehrotra & et al. (eds), 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2011). Lecture Notes in Artificial Intelligence, vol. 6704, Springer, Berlin, Germany, pp. 416-425, IEA/AIE 2011, 28/06/11. https://doi.org/10.1007/978-3-642-21827-9_43

A Diagnostic Reasoning Approach to Defect Prediction. / Lima Maranhao De Abreu, RF; Gonzalez Sanchez, A; van Gemund, AJC.
24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2011). ed. / KC Mehrotra; et al. Berlin, Germany: Springer, 2011. p. 416-425 (Lecture Notes in Artificial Intelligence; Vol. 6704).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A Diagnostic Reasoning Approach to Defect Prediction

AU - Lima Maranhao De Abreu, RF

AU - Gonzalez Sanchez, A

AU - van Gemund, AJC

PY - 2011

Y1 - 2011

KW - CWTS JFIS < 0.75

U2 - 10.1007/978-3-642-21827-9_43

DO - 10.1007/978-3-642-21827-9_43

M3 - Conference contribution

SN - 978-3-642-21821-7

SP - 416

EP - 425

BT - 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2011)

A2 - Mehrotra, KC

A2 - et al., null

PB - Springer

CY - Berlin, Germany

T2 - IEA/AIE 2011

Y2 - 28 June 2011 through 1 July 2011

ER -

Lima Maranhao De Abreu RF, Gonzalez Sanchez A, van Gemund AJC. A Diagnostic Reasoning Approach to Defect Prediction. In Mehrotra KC, et al., editors, 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2011). Berlin, Germany: Springer. 2011. p. 416-425. (Lecture Notes in Artificial Intelligence). doi: 10.1007/978-3-642-21827-9_43