A direct measurement scheme of amalgamated aging effects with novel on-chip sensor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

6 Citations (Scopus)
Original languageEnglish
Title of host publication21st IFIP/IEEE international conference on very large scale integration
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages1-6
Number of pages6
Publication statusPublished - 2013
EventVLSI-SoC 2013 - Piscataway
Duration: 7 Oct 20139 Oct 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceVLSI-SoC 2013
Period7/10/139/10/13

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